3D Integration for VLSI Systems

Herausgeber: Tan, Chuan Seng; Koester, Steven J; Chen, Kuan-Neng

• Gebundenes Buch

Produktbeschreibung

Three-dimensional (3D) integration is identified as a possible avenue for continuous performance growth in integrated circuits (IC). Wafer level 3D IC can take several forms, and they usually include a stack of several thinned IC layers that are vertically bonded and interconnected by through silicon via TSV. This book presents contributions by key researchers in this field, covering motivations, technology platforms, applications, and other design issues.

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Produktdetails

• Verlag: Taylor & Francis Ltd (Sales)
• Seitenzahl: 378
• Erscheinungstermin: 26. September 2011
• Englisch
• Abmessung: 229mm x 152mm x 22mm
• Gewicht: 671g
• ISBN-13: 9789814303811
• ISBN-10: 981430381X
• Artikelnr.: 37191727

Autorenporträt

Chuan Seng Tan, Kuan-Neng Chen

Inhaltsangabe

3D Integration Technology
Introduction and Overview. A Systems Perspective on 3D Integration: What is 3D? And What is 3D Good For? Wafer Bonding Techniques. TSV Etching. TSV Filling. 3D Technology Platform: Temporary Bonding and Release. 3D Technology Platform: Wafer Thinning, Stress Relief, and Thin Wafer Handling. Advanced Die
to
Wafer 3D Integration Platform: Self
Assembly Technology. Advanced Direct Bond Technology. Surface Modification Bonding at Low Temperature for Three
Dimensional Hetero
Integration. Through Silicon Via Implementation in CMOS Image Sensor Product. A 300
mm Wafer
Level Three
Dimensional Integration Scheme Using Tungsten Through
Silicon Via and Hybrid Cu
Adhesive Bonding. Power Delivery in 3D IC Technology with a Stratum Having an Array of Monolithic DC
DC Point
of
Load (PoL) Converter Cells. Thermal
Aware 3D IC Designs. 3D IC Design Automation Considering Dynamic Power and Thermal Integrity. Outlook.