Patrick Echlin, C. E. Fiori, Joseph Goldstein

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

• Broschiertes Buch

Produktbeschreibung

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

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Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.

Produktdetails

• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4757-9029-0
• Softcover reprint of the original 1st ed. 1986
• Seitenzahl: 476
• Erscheinungstermin: 8. Juni 2013
• Englisch
• Abmessung: 229mm x 152mm x 26mm
• Gewicht: 683g
• ISBN-13: 9781475790290
• ISBN-10: 1475790295
• Artikelnr.: 39937885

Autorenporträt

Joseph Goldstein leitet seit 1974 weltweit Retreats und Seminare in buddhistischer Meditation und ist Mitbegründer der Insight Meditation Society.
Seine Praxis begann er 1967, als er als Friedensaktivist in Thailand auf den Buddhismus stieß. Heute gilt er als einer der führenden Vertreter eines westlichen Buddhismus. In deutscher Sprache wurde von ihm (gemeinsam mit Jack Kornfield) das Buch Einsicht durch Meditation veröffentlicht.

Inhaltsangabe

1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.