Andere Kunden interessierten sich auch für
![Introduction to Semiconductor Device Yield Modeling]( "Introduction to Semiconductor Device Yield Modeling")
Introduction to Semiconductor Device Yield Modeling96,99 €![Semiconductor Quantum Wells and Superlattices for Long-Wavelength Infrared Detectors]( "Semiconductor Quantum Wells and Superlattices for Long-Wavelength Infrared Detectors")
Semiconductor Quantum Wells and Superlattices for Long-Wavelength Infrared Detectors84,99 €![Systematic Analysis of Bipolar and Mos Transistors]( "Systematic Analysis of Bipolar and Mos Transistors")
Systematic Analysis of Bipolar and Mos Transistors85,99 €![InP HBTs Growth, Processing and Applications]( "InP HBTs Growth, Processing and Applications")
InP HBTs Growth, Processing and Applications157,99 €![Advanced Semiconductor Heterostructures: Novel Devices, Potential Device Applications and Basic Properties]( "Advanced Semiconductor Heterostructures: Novel Devices, Potential Device Applications and Basic Properties")
Advanced Semiconductor Heterostructures: Novel Devices, Potential Device Applications and Basic Properties188,99 €![High-Speed Digital IC Technologies]( "High-Speed Digital IC Technologies")
High-Speed Digital IC Technologies153,99 €![Reliability and Degradation of Semiconductor Lasers and LEDs]( "Reliability and Degradation of Semiconductor Lasers and LEDs")
Reliability and Degradation of Semiconductor Lasers and LEDs165,99 €
