Alberto Bosio, Luigi Dilillo, Patrick Girard

Advanced Test Methods for Srams

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Mitwirkender: Girard, Patrick; Dilillo, Luigi; Bosio, Alberto

• Gebundenes Buch

Produktbeschreibung

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

Produktdetails

• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 12519989, 978-1-4419-0937-4
• 2010 edition
• Seitenzahl: 171
• Erscheinungstermin: 4. November 2009
• Englisch
• Abmessung: 241mm x 165mm x 23mm
• Gewicht: 432g
• ISBN-13: 9781441909374
• ISBN-10: 1441909370
• Artikelnr.: 26389886

Inhaltsangabe

Basics on SRAM Testing.- Resistive-Open Defects in Core-Cells.- Resistive-Open Defects in Pre-charge Circuits.- Resistive-Open Defects in Address Decoders.- Resistive-Open Defects in Write Drivers.- Resistive-Open Defects in Sense Amplifiers.- Faults Due to Process Variations in SRAMs.- Diagnosis and Design-for-Diagnosis.

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Basics on SRAM Testing.- Resistive-Open Defects in Core-Cells.- Resistive-Open Defects in Pre-charge Circuits.- Resistive-Open Defects in Address Decoders.- Resistive-Open Defects in Write Drivers.- Resistive-Open Defects in Sense Amplifiers.- Faults Due to Process Variations in SRAMs.- Diagnosis and Design-for-Diagnosis.