Andrew Briggs / Walter Arnold (Hgg.)

Advances in Acoustic Microscopy

Volume 2
Herausgeber: Arnold, Walter, Briggs, Andrew

• Gebundenes Buch

Produktbeschreibung

Volume 2 in this key series reviews the newest applications and techniques related to high resolution acoustic imaging. Chapters describe uses of the acoustic microscope in semiconductor research; a phase-sensitive acoustic microscope; and applications of digital time-reversal mirrors, among other topics. The text is illustrated with 275 halftones, line drawings, and tables. Like its predecessor, this new volume is an invaluable resource for researchers in engineering, materials science, physics, and biology who wish to learn about developments in this burgeoning field.

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Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.

Produktdetails

• Advances in Acoustic Microscopy 2
• Verlag: Springer, Berlin
• 1997
• Seitenzahl: 304
• Erscheinungstermin: 30. November 1996
• Englisch
• Abmessung: 235mm x 157mm x 24mm
• Gewicht: 645g
• ISBN-13: 9780306453441
• ISBN-10: 0306453444
• Artikelnr.: 22447830

Inhaltsangabe

1. Characterization of Electronic Components by Acoustic Microscopy.
1.1. Introduction.
1.2. Commonly Used Ultrasonic Microscope Equipment.
1.3. Failure Mechanisms Induced by Assembly
Related Problems.
1.4. Advantages and Limitations of Acoustic Microscopy in the Semiconductor Industry.
1.5. Ultrasonic Microscope Applications in the Production, Qualification, and Failure Analysis of Semiconductor Devices.
1.6. Conclusions.
References.
2. Principles and Applications of High
Frequency Medical Imaging.
2.1. Introduction.
2.2. Historical Perspective of Echographic Concepts.
2.3. High
Frequency Medical Ultrasonic Systems.
2.4. Scanning Modes and Scanning Electronics.
2.5. Ultrasonic High
Frequency Imaging Transducers.
2.6. Dermatological Applications.
2.7. Ophthalmological Applications.
2.8. Intravascular Ultrasound Imaging.
2.9. Conclusion.
References.
3. Interaction of Acoustic Waves with Solid Surfaces.
3.1. Introduction.
3.2. Acoustic Reflection Coefficient at a Liquid/Solid Interface.
3.3. Layered Materials and Guided Waves.
3.4. Method and Apparatus of Measurement.
3.5. Applications to Materials Characterization.
3.6. Conclusion.
References.
Appendixes.
4. Scanning Ultrasonic Microscopy with Phase Contrast.
4.1. The Phase
Sensitive Acoustic Microscope.
4.2. Topographical Measurements.
4.3. Lens Characterization.
4.4. Determination of the Elastic Properties of Small Samples.
4.5. Determination of Elastic Constants of Single Crystals.
References.
5. Ultrasonic Focusing with Time Reversal Mirrors.
5.1. Introduction.
5.2. Principles of Time Reversal Acoustics.
5.3. Applications of Time Reversal Mirrors.
5.4. The DORT Method (Décomposition de l'Opérateur de Retournement Temporel).
5.5. Conclusion.
References.

Rezensionen

'An outstanding work.' -- The Journal of Scanning Microscopies, January 1998

'Very well written and illustrated...the subjects selected are of major importance and...the editors (and the authors) have perfomed an outstanding work in presenting in the same volume both fundamental studies and medical or industrial applications.' -- Scanning, 1998