The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with…mehr
The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
I. Microbeam Techniques and Imaging Methods for Materials Characterization.- Microdiffraction with Synchrotron Beams (or Ultra-High Pressure Research).- Microstructural and Chemical Analysis Using Electron Beams: The Analytical Electron Microscope.- X-Ray Imaging of Surface and Internal Structure.- X-Ray Imaging: Status and Trends.- Secondary Ion Mass Spectrometry and Related Techniques.- X-Ray Microscopy using Collimated and Focussed Synchrotron Radiation.- Imaging with Spectroscopic Data.- Small Area X-Ray Diffraction Techniques; Errors in Strain Measurement.- Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys.- An Automated X-Ray Microfluorescence Materials Analysis System.- Industrial Applications of X-Ray Computed Tomography.- II. Characterization of Thin Films by XRD and XRF.- Correlations Between X-Ray Microstructures and Magnetic Properties of CoCrTa Alloy Thin Films.- Defect Structure of Synthetic Diamond and Related Phases.- Microstructural Characterization of Thin Polycrystalline Films by X-Ray Diffraction.- Automated X-Ray Topography and Rocking Curve Analysis: A reliability Study.- Grazing Incidence X-Ray Scattering Studies of Single Quantum Wells.- Dynamical Theory of Asymmetric X-Ray Diffraction for Strained Crystal Wafers.- Dynamical X-Ray Diffraction Simulations for Asymmetric Reflections for III-V Semiconductors Multilayers.- Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters.- III. X-Ray Stress/Strain Determination, Fractography, Diffraction, Line Broadening Analysis.- The Phi-Integral Method for X-Ray Residual Stress Measurements.- Oscillations in Interplanar Spacing vs. Sin2?, A FEM Analysis.- Focusing Circle Errors in X-Ray Residual Stress Measurements of Nickel-BasedMaterials.- Residual Stress Analysis in Steels Having Preferred Orientation by Use of Synchrotron Radiation Source.- Macro and Micro-Stress Distributions in Filled Epoxy Systems.- Residual Stress Determination in Al2O3/SiC (Whisker) Composites by X-Ray Diffraction.- A Comparison of Diffraction Elastic Constants of Steel Measured with X-Rays and Neutrons.- Residual Stress in Two Dental Alloys During Porcelain Application.- Pre-Cracking Technique and Its Application to X-Ray Fractography of Alumina Ceramics.- X-Ray Fractography of Stress Corrosion Cracking in AISI 4340 Steel Under Controlled Electrode Potential.- A New Method for Evaluating X-Ray Diffraction Peak Broadening with Engineering Applications.- X-Ray Line Broadening Study on Shock-Modified Hematite.- IV. Quantitative and Qualitative XRD Phase Analysis.- Problems and Solutions in Quantitative Analysis of Complex Mixtures by X-Ray Powder Diffraction.- Preliminary Results from a Powder Diffraction Data Intensity Round-Robin.- The Estimation of Limits of Detection in RIM Quantitative X-Ray Diffraction Analysis.- Automated Quantitative Multiphase Analysis Using a Focusing Transmission Diffractometer in Conjunction with a Curved Position Sensitive Detector.- X-Ray Diffraction Analysis of Fly Ash.- Measuring Graphitic Carbon and Crystalline Minerals in Coals and Bottom Ashes.- V. X-Ray and Neutron Diffraction Applications Including Superconductors.- High Temperature Stability of Superconducting YBa2Cu3Ox as Characterized by X-ray Diffraction.- X-Ray Study of the BaO-Y2O3-CuOx System.- Comparison of Calculated and Experimental Powder X-Ray Diffraction Patterns of Organic Materials.- Neutron Diffraction - A Probe for Grain Size and Preferred Orientation in Zircaloy-Clad Uranium.- Applications of Pulsed Neutron PowderDiffraction to Actinide Elements.- VI. XRD Techniques, Instrumentation and P.C. Applications.- Asymmetric Crystals Re-Visited.- A 4 Crystal Monochromator for High Resolution Rocking Curves.- Laser Aligned Laue Technique for Small Crystals.- A Novel X-Ray Powder-Diffractometer, Measuring Preferred-Orientations.- Using Digitized X-Ray Powder Diffraction Scans as Input for a New PC-AT Search/Match Program.- PC Based Topography Technique.- VII. XRF Techniques, Instrumentation and Mathematical Models.- X-Ray Fluorescence Analysis of Alloy and Stainless Steels Using a Mercuric Iodide Detector.- X-Ray Fluorescence Spectrometry with Gas Proportional Scintillation Counters.- Advances and Enhancements in Light Element EDXRF.- Window Area Effects in the Detector Efficiency for Source Excited EDXRF Geometries.- A New Analysis Principle for EDXRF: The Monte-Carlo - Library Least-Squares Analysis Principle.- Defining and Deriving Theoretical Influence Coefficients in XRF Spectrometry.- VIII. Synchrotron Radiation and Other Applications of XRF.- Appearance Potential X-Ray Fluorescence Analysis.- Near-Surface Analysis of Semiconductor Using Grazing Incidence X-Ray Fluorescence.- A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation.- Correction Method for Particle-Size Effect in XRF Analysis of Ore Slurries.- Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry.- Author Index.
I. Microbeam Techniques and Imaging Methods for Materials Characterization.- Microdiffraction with Synchrotron Beams (or Ultra-High Pressure Research).- Microstructural and Chemical Analysis Using Electron Beams: The Analytical Electron Microscope.- X-Ray Imaging of Surface and Internal Structure.- X-Ray Imaging: Status and Trends.- Secondary Ion Mass Spectrometry and Related Techniques.- X-Ray Microscopy using Collimated and Focussed Synchrotron Radiation.- Imaging with Spectroscopic Data.- Small Area X-Ray Diffraction Techniques; Errors in Strain Measurement.- Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys.- An Automated X-Ray Microfluorescence Materials Analysis System.- Industrial Applications of X-Ray Computed Tomography.- II. Characterization of Thin Films by XRD and XRF.- Correlations Between X-Ray Microstructures and Magnetic Properties of CoCrTa Alloy Thin Films.- Defect Structure of Synthetic Diamond and Related Phases.- Microstructural Characterization of Thin Polycrystalline Films by X-Ray Diffraction.- Automated X-Ray Topography and Rocking Curve Analysis: A reliability Study.- Grazing Incidence X-Ray Scattering Studies of Single Quantum Wells.- Dynamical Theory of Asymmetric X-Ray Diffraction for Strained Crystal Wafers.- Dynamical X-Ray Diffraction Simulations for Asymmetric Reflections for III-V Semiconductors Multilayers.- Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters.- III. X-Ray Stress/Strain Determination, Fractography, Diffraction, Line Broadening Analysis.- The Phi-Integral Method for X-Ray Residual Stress Measurements.- Oscillations in Interplanar Spacing vs. Sin2?, A FEM Analysis.- Focusing Circle Errors in X-Ray Residual Stress Measurements of Nickel-BasedMaterials.- Residual Stress Analysis in Steels Having Preferred Orientation by Use of Synchrotron Radiation Source.- Macro and Micro-Stress Distributions in Filled Epoxy Systems.- Residual Stress Determination in Al2O3/SiC (Whisker) Composites by X-Ray Diffraction.- A Comparison of Diffraction Elastic Constants of Steel Measured with X-Rays and Neutrons.- Residual Stress in Two Dental Alloys During Porcelain Application.- Pre-Cracking Technique and Its Application to X-Ray Fractography of Alumina Ceramics.- X-Ray Fractography of Stress Corrosion Cracking in AISI 4340 Steel Under Controlled Electrode Potential.- A New Method for Evaluating X-Ray Diffraction Peak Broadening with Engineering Applications.- X-Ray Line Broadening Study on Shock-Modified Hematite.- IV. Quantitative and Qualitative XRD Phase Analysis.- Problems and Solutions in Quantitative Analysis of Complex Mixtures by X-Ray Powder Diffraction.- Preliminary Results from a Powder Diffraction Data Intensity Round-Robin.- The Estimation of Limits of Detection in RIM Quantitative X-Ray Diffraction Analysis.- Automated Quantitative Multiphase Analysis Using a Focusing Transmission Diffractometer in Conjunction with a Curved Position Sensitive Detector.- X-Ray Diffraction Analysis of Fly Ash.- Measuring Graphitic Carbon and Crystalline Minerals in Coals and Bottom Ashes.- V. X-Ray and Neutron Diffraction Applications Including Superconductors.- High Temperature Stability of Superconducting YBa2Cu3Ox as Characterized by X-ray Diffraction.- X-Ray Study of the BaO-Y2O3-CuOx System.- Comparison of Calculated and Experimental Powder X-Ray Diffraction Patterns of Organic Materials.- Neutron Diffraction - A Probe for Grain Size and Preferred Orientation in Zircaloy-Clad Uranium.- Applications of Pulsed Neutron PowderDiffraction to Actinide Elements.- VI. XRD Techniques, Instrumentation and P.C. Applications.- Asymmetric Crystals Re-Visited.- A 4 Crystal Monochromator for High Resolution Rocking Curves.- Laser Aligned Laue Technique for Small Crystals.- A Novel X-Ray Powder-Diffractometer, Measuring Preferred-Orientations.- Using Digitized X-Ray Powder Diffraction Scans as Input for a New PC-AT Search/Match Program.- PC Based Topography Technique.- VII. XRF Techniques, Instrumentation and Mathematical Models.- X-Ray Fluorescence Analysis of Alloy and Stainless Steels Using a Mercuric Iodide Detector.- X-Ray Fluorescence Spectrometry with Gas Proportional Scintillation Counters.- Advances and Enhancements in Light Element EDXRF.- Window Area Effects in the Detector Efficiency for Source Excited EDXRF Geometries.- A New Analysis Principle for EDXRF: The Monte-Carlo - Library Least-Squares Analysis Principle.- Defining and Deriving Theoretical Influence Coefficients in XRF Spectrometry.- VIII. Synchrotron Radiation and Other Applications of XRF.- Appearance Potential X-Ray Fluorescence Analysis.- Near-Surface Analysis of Semiconductor Using Grazing Incidence X-Ray Fluorescence.- A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation.- Correction Method for Particle-Size Effect in XRF Analysis of Ore Slurries.- Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry.- Author Index.
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