C.S. Barrett (ed.) / M. Amara / Ting C. Huang / Nick Bernard / Dietrich Knorr

Advances in X-Ray Analysis

Herausgegeben:Barrett, Charles S.; Amara, M.; Huang, Ting C.; Bernard, Nick; Knorr, Dietrich

• Gebundenes Buch

Produktbeschreibung

The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop­ ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.

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Produktdetails

• Advances in X-Ray Analysis 34
• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-0-306-44003-8
• 1991.
• Seitenzahl: 743
• Erscheinungstermin: 30. Juni 1991
• Englisch
• Gewicht: 1551g
• ISBN-13: 9780306440038
• ISBN-10: 0306440032
• Artikelnr.: 27634747

Inhaltsangabe

Recent Developments and Results in Total Reflection X-Ray Fluorescence Analysis.- Glancing Angle X-Ray Absorption Spectroscopy.- Semiconductor Surface Characterization by Synchrotron X-Ray Fluorescence Analysis.- Total-Reflection X-Ray Fluorescence of Thin Layers on and in Solids.- Trace Element Analysis of Solutions at the PPB Level.- Trace Analysis Using Eds: Applications to Thin-Film and Heterogeneous Samples.- Grazing Incidence X-Ray Fluorescence Analysis with Monochromatic Radiation.- Impurity Analysis on Si Wafer Using Monochro-Trex.- Chemical State Analysis by Soft X-Ray Emission Spectra with Molecular-Orbital Calculations.- Fundamentals of X-Ray Spectrometric Analysis Using Low-Energy Electron Excitation.- Chemical Bonding Studies of Solutions by High Resolution X-Ray Fluorescence Spectroscopy.- Advances in Boron Measurement with Wavelength Dispersive XRF.- Soft and Ultra-Soft X-Ray Spectrometry Using Long-Wavelength Dispersive Devices.- Requirement Analysis and Preliminary Design For Energy Dispersive X-Ray Fluorescence Analysis Software.- Quantitative XRF Analysis Using the Fundamental Algorithm.- Practical Application for the use of Statistics to Establish Quality Control and Implement Quality Assurance in X-Ray Fluorescence.- Drift in Energy Calibration of Energy Dispersive X-Ray Fluorescence Analyzers and Its Correction.- Current and Future Energy Dispersive Exafs Detector Systems.- High Throughput Rate Solid State Detector Systems for Fluorescence EXAFS.- A Review of the Relative Merits of Low Powered WDXRF EDXRF Spectrometers for Routine Quantitative Analysis.- Imaging XPS. A Contribution to 3D X-Ray Analysis.- Graphite Fusion of Geological Samples.- Fast, High-Resolution X-Ray Microfluorescence Imaging.- High-Temperature Displacement Measurement using AScanning Focussed X-Ray Line Source.- On-Belt Determination of Calcium Concentration by X-Ray Fluorescence.- Niobium Concentration Measurement in Steel Samples with TXRF.- Mass Absorption Coefficient Determination using Compton Scattered Tube Radiation: Applications, Limitations and Pitfalls.- Trace Element Analysis of Rocks by X-Ray Spectrometry.- X-Ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements.- X-Ray Fluorescence Analysis of High-Density Brines using a Compton Scattering Ratio Technique.- Secondary Target X-Ray Excitation in Vivo Measurement of Lead in Bone.- Phosphorus Determination in Borophosphosilicate or Phosphosilicate Glass Films on a Si Wafer by Wavelength Dispersive X-Ray Spectroscopy.- Non-Destructive Analysis of Venezuelan Artifacts of Different Sizes and Shapes for Provenance Studies.- X-Ray Fluorescence as a Problem-Solving Tool in the Paper Industry.- X-Ray Detectors: Pulse Height Shifts, Escape Peaks and Counting Losses.- Measurement of Mass Absorption Coefficients using Compton-Scattered Cu Radiation in X-Ray Diffraction Analysis.- Evaluation of the X-Ray Response of a Position-Sensitive Microstrip Detector with An Integrated Readout Chip.- Practical and "Unusual" Applications in X-Ray Diffraction using Position Sensitive Detectors.- CCD Based X-Ray Detectors.- Wide Angle and Small Angle X-Ray Scattering Applications using a Two-Dimensional Area Detector.- Evaluation of Reference X-Ray Diffraction Patterns in the Icdd Powder Diffraction File.- Matchdb-A Program for the Identification of Phases using a Digitized Diffraction-Pattern Database.- X-Ray Diffraction Analysis of Fly Ash. II. Results.- Development of a Calibration Method for Quantitative X-Ray Powder Diffraction ofSize-Segregated Aerosols.- Strategies for Preferred Orientation Corrections in X-Ray Powder Diffraction using Line Intensity Ratios.- Quantification of Carbamazepine in Tablets by Powder X-Ray Diffractometry.- Mass Absorption Corrected X-Ray Diffraction Analysis of Entrained-Flow Reactor Coal Combustion Products.- A Focusing System for X-Ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell.- Phase Analysis of Metallic Plutonium-Containing Fuel Alloys using Neutron Diffraction.- High-Temperature XRD Analysis of Polymers.- Residual Strains in Al2O3/Sic (Whisker) Composite From 25-1000°C.- Applications of X-Ray Diffraction Crystallite Size/Strain Analysis to Seismosaurus Dinosaur Bone.- The Substructure of Austenite and Martensite Through a Carburized Surface.- Determination of Lattice Parameter and Strain of ? Phases in Nickel-Base Superalloys by Synchrotron Radiation Parallel Beam Diffractometry.- The Effect of Satellite Lines From the X-Ray Source on X-Ray Diffraction Peaks.- X-Ray Topography and Tem Study of Crystal Defect Propagation in Epitaxially Grown Algaas Layers on Gaas(001).- Lineshape Analysis of X-Ray Diffraction Profiles: Polyethylene and Model Copolymers.- Double-Crystal X-Ray Diffraction Studies of Si Ion-Implanted and Pulsed Laser-Annealed Gaas.- X-Ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition.- Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films.- The Thickness Measurements of Thin Bulk Film by X-Ray Method.- Oxygen Concentration Determination in Silicon Single Crystals by Precision Lattice Parameter Measurement.- Thermal Stress Relaxation in Vapor Deposited Thin Films.- An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data.-Residual Stresses in Railroad Car Wheels.- Measurement of Residual Stresses by X-Ray Diffraction Near Simulated Heat Affected Zones in Austenitic Stainless Steels.- Use of X-Ray Diffraction using Gaussian Curve Method for Measuring Plastic Strain of Steels.- X-Ray Elastic Constants For ?-SiC and Residual Stress Anisotropy in a Hot-Pressed Al2O3/SiC (Whisker) Composite.- X-Ray Study on Fatigue Fracture Surfaces of Aluminum Alloy Reinforced with Silicon Carbide Whiskers.- Residual Stress Analysis of Silicon Nitride to Carbon Steel Joint.- Residual Stresses in Unidirectional Al2O3 Fiber/Silicate Glass Composites by X-Ray Diffraction.- X-Ray Residual Stress Measurement of Ground Surface of Metal-Ceramic Composite.- Determination of X-Ray Elastic Constants in a Ti-14Al-21Nb Alloy and a Ti-14Al-21Nb/Sic Metal Matrix Composite.- A Method for X-Ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel.- Fracture Analysis of Nodular Cast Iron by X-Ray Fractography.- X-Ray Fractographic Study on Alumina and Zirconia Ceramics.- Author Index.