Advances in X-Ray Analysis

Volume 35B
Herausgegeben von Barrett, C.S.; Gilfrich, John V.; Huang, Ting C.; Jenkins, Ron; McCarthy, G.J.

• Broschiertes Buch

Produktbeschreibung

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

Produktdetails

• Advances in X-Ray Analysis 35B
• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4613-6532-7
• Softcover reprint of the original 1st ed. 1992
• Seitenzahl: 648
• Erscheinungstermin: 21. November 2012
• Englisch
• Abmessung: 244mm x 170mm x 35mm
• Gewicht: 1101g
• ISBN-13: 9781461365327
• ISBN-10: 1461365325
• Artikelnr.: 37476408

Inhaltsangabe

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.