Advances in X-Ray Analysis

Volume 36
Herausgegeben von Gilfrich, John V.; Huang, Ting C.; Hubbard, C. R.; James, M. R.; Jenkins, Ron; Lachance, G. R.

• Broschiertes Buch

Produktbeschreibung

The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these "leading-edge" developments, the topic for the Plenary Session was "Grazing-Incidence X Ray Characterization of Materials. " The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K. , opened the session with a lecture on "Grazing Incidence X-Ray Scattering from Thin Films. " He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on "Grazing Incidence Diffuse X-Ray Scattering from Thin Films. " He concentrated on the use of newly developed "off-specular" reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.

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Produktdetails

• Verlag: Springer, Berlin
• Softcover reprint of the original 1st ed. 1993
• Seitenzahl: 712
• Erscheinungstermin: 24. Oktober 2012
• Englisch
• Abmessung: 254mm x 178mm x 38mm
• Gewicht: 1315g
• ISBN-13: 9781461362937
• ISBN-10: 1461362938
• Artikelnr.: 37476834

Inhaltsangabe

I. Mathematical Techniques in X-Ray Spectrometry.- II. Analysis of Light Elements by X-Ray Spectrometry.- III. XRS Techniques and Instrumentation.- IV. On-Line, Industrial and Other Applications of XRS.- V. X-Ray Characterization of Thin Films.- VI. Whole Pattern Fitting, Phase Analysis by Diffraction Methods.- VII. Polymer Applications of XRD.- VIII. High-Temperature and Non-Ambient Applications of XRD.- IX. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis.- X. XRD Techniques and Instrumentation.- Author Index.