Deane K. Smith Department of Geosciences The Pennsylvania State University Computer automation of x-ray powder diffraction has been one of the dominant topics of this conference for many years. In fact, the first description of such instrumentation dates back to 1967, Rex (1). The modern instruments are considerably more sophisticated than this early unit, but the goals of automation are essentially unchanged. They are to obtain better data at a faster rate with less effort than is possible with manual instrumentation. Indeed "laziness is the mother of invention. " The emphasis of most of the…mehr
Deane K. Smith Department of Geosciences The Pennsylvania State University Computer automation of x-ray powder diffraction has been one of the dominant topics of this conference for many years. In fact, the first description of such instrumentation dates back to 1967, Rex (1). The modern instruments are considerably more sophisticated than this early unit, but the goals of automation are essentially unchanged. They are to obtain better data at a faster rate with less effort than is possible with manual instrumentation. Indeed "laziness is the mother of invention. " The emphasis of most of the papers on automation has been tm-lard hardware-controlling systems and aC,"lieving accurate d values and good intensities for effective phase identification and phase characterization. Tests of good data include successful pattern searching and matching. Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. Intensity accuracy is much harder to test unless a theoretical data set is available. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied. In organizing this plenary session, an attempt was made to focus on applications, especially those which are at the forefront of materials studies. In addition many other applications papers were encouraged with the result that a good variety of such topics are included in the program this year.Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Practical Applications of Automated Analysis of Diffraction Data.- Application of the Rietveld Method for Structure Refinement with Powder Diffraction Data.- Crystallinity, Crystallite Size and Lattice Perfection in Fibrous Polymers.- Quantitative Analysis of Dust Samples from Occupational Environments Using Computerautomated X-Ray Diffraction.- Porotectosilicate Structure Determination from Model Building.- Analysis and Interpretation of Diffraction Data from Amorphous Materials.- XRD Mathematical Methods, Techniques and Instrumentation.- X-Ray Powder Diffraction in Europe.- A Hanawalt Type Phase Identification Procedure for a Minicomputer.- Qualitative Phase Analysis Using an X-Ray Powder Diffractometer.- NBS*AIDS80: A Fortran Program to Evaluate Crystallographic Data.- Reproducibility and Precision of Measurements of Guinier Powder Patterns Using Powdered Silicon Calibrant.- An Approach to the Automation of a Multifunction X-Ray Diffraction Laboratory.- XRD Applications of Position Sensitive Detectors, X-Ray Strain Measurement, Fatigue Characterization.- The Use and Accuracy of Continuously Scanning Position-Sensitive Detector Data in X-Ray Powder Diffraction.- A New Model of X-Ray Position Sensitive Detector Developed in France.- Use of a Position Sensitive Detector.- A Versatile X-Ray Stress Analyzer Using a Position Sensitive Detector.- Integral Type, Position-Sensitive Proportional Chamber with Multiplexer Readout System for X-Ray Diffraction Experiments.- An Area-Imaging Proportional Counter for X-Ray Diffraction.- Stress Measurement in Stainless Steel by Use of Monochromatic Cr-K? X-Rays and a Position Sensitive Detector.- A High-Speed Signal Processor Using a Digital Divider for Position Sensitive Proportional Counters.- X-Ray Spectrometer for EXAFS Using aPosition Sensitive Detector.- X-Ray Stress Measurements in Ground Surface of Steel by Position Sensitive Detector.- Time-Resolved X-Ray Powder Diffractometry Using Linear Position-Sensitive Proportional Counters.- Technical Feasibility of a Borehole Probe for in-Situ X-Ray Diffraction Analysis.- Measurement of Cumulative Fatigue Damage by X-Ray Double-Crystal and Scanning Diffraction Methods.- An X-Ray Study of Ion-Implanted Liquid Phase Epitaxial Garnet Films with a Single Crystal Diffractometer.- Residual Stress Change Due to Rolling Contact of Ball and Roller Bearings.- Compression and Compressibility Studies of Plutonium and a Plutonium-Gallium Alloy.- X-Ray Diffraction Evaluation of Adhesive Bonds and Stress Measurement with Diffracting Paint.- Other XRD Applications.- Separation of Broad Crystalline and Amorphous X-Ray Diffraction Peaks.- Energy-Dispersive Diffraction Analysis of the Structure of Metallic Glasses.- Internal Standards for Quantitative X-Ray Phase Analysis: Crystallinity and Solid Solution.- Application of Gandolfi X-Ray Diffraction to the Characterization of Reaction Products from the Alteration of Simulated Nuclear Wastes.- The Characterization of Alpha and Intermediate Aluminum Oxide Mixtures by Semi-Automated XRD.- Experimental Evaluation of Peak Height Approximation for X-Ray Diffracted Integrated Intensity Method.- The Application of an Automated Single Crystal Orienter for Large Specimens.- XRF Applications in the Minerals Industry.- On Stream Analysis of Lead and Zinc Ore Fractions Using Energy Dispersive and Wavelength Dispersive Techniques.- On-Stream Analysis of Float Process Slurries by XRF.- X-Ray Fluorescence Analysis of High Z Materials with Mercuric Iodide Room Temperature Detectors.- Applicability of U L X-Ray Lines for the Determination of Low Uranium Concentrations.- Applicability of PIXE and XRF to Fast Drill Core Analysis in Air.- Use of Compton Scattering in X-Ray Fluorescence for Determination of Ash in Indian Coal.- XRF Techniques and Instrumentation.- The Present State of X-Ray Spectrometry.- Improving the Detection Limit in Wavelength Dispersive XRF.- Background and Sensitivity Considerations of X-Ray Fluorescence Analysis with a Room-Temperature Mercuric Iodide Spectrometer.- Multiple Scattering and the Polarization of X-Rays.- Advances in Low-Energy Electron-Induced X-Ray Spectroscopy (LEEIXS).- Escape Peak Intensities in Argon/Methane Flow Detectors.- Leveling Device for Forming X-Ray Specimen.- Other XRF Applications and Mathematical Methods.- Monte Carlo Determinations of Optimal Photon Energies for XRF Analysis of Iodine in Vivo.- Lead and Barium in Archaeological Roman Skeletons Measured by Nondestructive X-Ray Fluorescence Analysis.- Analysis of Refractory Metals and WC-Based Hard Metals by Energy Dispersive X-Ray Fluorescence.- An Improved Sample Preparation and Analysis Technique for the Determination of Minor Elements in Catalytic Materials by Radioisotope Induced X-Ray Fluorescence.- Glass and Glass Raw Materials Analysis Using a Philips PW1600 Wavelength Dispersive X-Ray Spectrometer.- A General Method of Blank Subtraction for Quantitative X-Ray Fluorescence Intensity Measurements.- A Rapid and Precise Computer Method for Qualitative X-Ray Fluorescence Analysis.- Monte Carlo Studies on the Design of Radioisotope Source Holders and Shields for EDXRF Analyzers.- Author Ikndex.
Practical Applications of Automated Analysis of Diffraction Data.- Application of the Rietveld Method for Structure Refinement with Powder Diffraction Data.- Crystallinity, Crystallite Size and Lattice Perfection in Fibrous Polymers.- Quantitative Analysis of Dust Samples from Occupational Environments Using Computerautomated X-Ray Diffraction.- Porotectosilicate Structure Determination from Model Building.- Analysis and Interpretation of Diffraction Data from Amorphous Materials.- XRD Mathematical Methods, Techniques and Instrumentation.- X-Ray Powder Diffraction in Europe.- A Hanawalt Type Phase Identification Procedure for a Minicomputer.- Qualitative Phase Analysis Using an X-Ray Powder Diffractometer.- NBS*AIDS80: A Fortran Program to Evaluate Crystallographic Data.- Reproducibility and Precision of Measurements of Guinier Powder Patterns Using Powdered Silicon Calibrant.- An Approach to the Automation of a Multifunction X-Ray Diffraction Laboratory.- XRD Applications of Position Sensitive Detectors, X-Ray Strain Measurement, Fatigue Characterization.- The Use and Accuracy of Continuously Scanning Position-Sensitive Detector Data in X-Ray Powder Diffraction.- A New Model of X-Ray Position Sensitive Detector Developed in France.- Use of a Position Sensitive Detector.- A Versatile X-Ray Stress Analyzer Using a Position Sensitive Detector.- Integral Type, Position-Sensitive Proportional Chamber with Multiplexer Readout System for X-Ray Diffraction Experiments.- An Area-Imaging Proportional Counter for X-Ray Diffraction.- Stress Measurement in Stainless Steel by Use of Monochromatic Cr-K? X-Rays and a Position Sensitive Detector.- A High-Speed Signal Processor Using a Digital Divider for Position Sensitive Proportional Counters.- X-Ray Spectrometer for EXAFS Using aPosition Sensitive Detector.- X-Ray Stress Measurements in Ground Surface of Steel by Position Sensitive Detector.- Time-Resolved X-Ray Powder Diffractometry Using Linear Position-Sensitive Proportional Counters.- Technical Feasibility of a Borehole Probe for in-Situ X-Ray Diffraction Analysis.- Measurement of Cumulative Fatigue Damage by X-Ray Double-Crystal and Scanning Diffraction Methods.- An X-Ray Study of Ion-Implanted Liquid Phase Epitaxial Garnet Films with a Single Crystal Diffractometer.- Residual Stress Change Due to Rolling Contact of Ball and Roller Bearings.- Compression and Compressibility Studies of Plutonium and a Plutonium-Gallium Alloy.- X-Ray Diffraction Evaluation of Adhesive Bonds and Stress Measurement with Diffracting Paint.- Other XRD Applications.- Separation of Broad Crystalline and Amorphous X-Ray Diffraction Peaks.- Energy-Dispersive Diffraction Analysis of the Structure of Metallic Glasses.- Internal Standards for Quantitative X-Ray Phase Analysis: Crystallinity and Solid Solution.- Application of Gandolfi X-Ray Diffraction to the Characterization of Reaction Products from the Alteration of Simulated Nuclear Wastes.- The Characterization of Alpha and Intermediate Aluminum Oxide Mixtures by Semi-Automated XRD.- Experimental Evaluation of Peak Height Approximation for X-Ray Diffracted Integrated Intensity Method.- The Application of an Automated Single Crystal Orienter for Large Specimens.- XRF Applications in the Minerals Industry.- On Stream Analysis of Lead and Zinc Ore Fractions Using Energy Dispersive and Wavelength Dispersive Techniques.- On-Stream Analysis of Float Process Slurries by XRF.- X-Ray Fluorescence Analysis of High Z Materials with Mercuric Iodide Room Temperature Detectors.- Applicability of U L X-Ray Lines for the Determination of Low Uranium Concentrations.- Applicability of PIXE and XRF to Fast Drill Core Analysis in Air.- Use of Compton Scattering in X-Ray Fluorescence for Determination of Ash in Indian Coal.- XRF Techniques and Instrumentation.- The Present State of X-Ray Spectrometry.- Improving the Detection Limit in Wavelength Dispersive XRF.- Background and Sensitivity Considerations of X-Ray Fluorescence Analysis with a Room-Temperature Mercuric Iodide Spectrometer.- Multiple Scattering and the Polarization of X-Rays.- Advances in Low-Energy Electron-Induced X-Ray Spectroscopy (LEEIXS).- Escape Peak Intensities in Argon/Methane Flow Detectors.- Leveling Device for Forming X-Ray Specimen.- Other XRF Applications and Mathematical Methods.- Monte Carlo Determinations of Optimal Photon Energies for XRF Analysis of Iodine in Vivo.- Lead and Barium in Archaeological Roman Skeletons Measured by Nondestructive X-Ray Fluorescence Analysis.- Analysis of Refractory Metals and WC-Based Hard Metals by Energy Dispersive X-Ray Fluorescence.- An Improved Sample Preparation and Analysis Technique for the Determination of Minor Elements in Catalytic Materials by Radioisotope Induced X-Ray Fluorescence.- Glass and Glass Raw Materials Analysis Using a Philips PW1600 Wavelength Dispersive X-Ray Spectrometer.- A General Method of Blank Subtraction for Quantitative X-Ray Fluorescence Intensity Measurements.- A Rapid and Precise Computer Method for Qualitative X-Ray Fluorescence Analysis.- Monte Carlo Studies on the Design of Radioisotope Source Holders and Shields for EDXRF Analyzers.- Author Ikndex.
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