This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
This book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Basel Halak is the director of the Embedded Systems Master program at Southampton University. He is a member of the Sustainable Electronics Research group, as well as, Cyber Security group at Electronics and Computer Science School (ECS). He has written over 60 conference and journal papers, and authored two books. He has received his PhD degree in Microelectronics System Design from Newcastle University. He was then awarded a knowledge transfer fellowship to develop secure and energy efficient design for portable health care monitoring systems. His background is on the design and implementation of microelectronics systems, with special focus on developing secure hardware implementation for cryptographic primitives such as physically unclonable functions. Dr Halak lectures on digital design, Secure Hardware and Cryptography, supervises a number of MSc and PhD students, and leading the European Masters in Embedded Computing Systems (EMECS). He is the recipient of the Vice Chancellor Teaching Award in 2016, and the bronze leaf award in IEEE PRIME conference for his paper on current-based physically unclonable functions. He is a senior fellow of the Higher Education Academy (HEA), a guest editor of the IET CDT, and serves on several technical program committees such as IEEE ICCCA, ICCCS, MTV, IVSW, MicDAT and EWME. He is also member of hardware security working group of the World Wide Web Consortium (W3C).
Inhaltsangabe
Chapter 1. Understanding Ageing Mechanisms.- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits.- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software.- Chapter 4. Ageing Mitigation Techniques for SRAM Memories.- Chapter 5. Ageing-aware Logic Synthesis.- Chapter 6. On-Chip Ageing Monitoring and System Adaptation.- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers.- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
Chapter 1. Understanding Ageing Mechanisms.- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits.- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software.- Chapter 4. Ageing Mitigation Techniques for SRAM Memories.- Chapter 5. Ageing-aware Logic Synthesis.- Chapter 6. On-Chip Ageing Monitoring and System Adaptation.- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers.- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
Chapter 1. Understanding Ageing Mechanisms.- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits.- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software.- Chapter 4. Ageing Mitigation Techniques for SRAM Memories.- Chapter 5. Ageing-aware Logic Synthesis.- Chapter 6. On-Chip Ageing Monitoring and System Adaptation.- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers.- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
Chapter 1. Understanding Ageing Mechanisms.- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits.- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software.- Chapter 4. Ageing Mitigation Techniques for SRAM Memories.- Chapter 5. Ageing-aware Logic Synthesis.- Chapter 6. On-Chip Ageing Monitoring and System Adaptation.- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers.- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
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