Sarah Fearn

Broschiertes Buch

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Beschreibung

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

Autor

Dr. Sarah Fearn is a Research Officer, Surface Analysis in the Materials Department at Imperial College London, where she conducts near- surface analysis of SOFCs and ionic conductivity measurements on nano-engineered structures. Her current research techniques include: isotope exchange, secondary ion mass spectrometry (SIMS), focused ion beam (FIB) microscopy, and low-energy ion scattering (LEIS). She received her PhD in 1999 from Imperial College London and spent nearly two years as a commercial SIMS analyst with Cascade Scientific before joining ICL in 2002.

Produktdetails

• Verlag: Morgan & Claypool Publishers
• Seitenzahl: 68
• Erscheinungstermin: 16. Oktober 2015
• Englisch
• Abmessung: 254mm x 178mm x 5mm
• Gewicht: 192g
• ISBN-13: 9781681740249
• ISBN-10: 1681740249
• Artikelnr.: 44041308