Alain Lodini (ed.)

Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

Herausgeber: Fitzpatrick, M E; Lodini, Alain

• Gebundenes Buch

Produktbeschreibung

Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the

Produktdetails

• Verlag: Taylor and Francis
• Seitenzahl: 366
• Erscheinungstermin: 6. Februar 2003
• Englisch
• Abmessung: 236mm x 154mm x 35mm
• Gewicht: 652g
• ISBN-13: 9780415303972
• ISBN-10: 0415303974
• Artikelnr.: 21565205

Autorenporträt

Fitzpatrick, M.E. Lodini, Alain

Inhaltsangabe

Section 1: General applications of neutron and synchrotron radiation to
materials research. Section 2: Methods and problems in residual stress
determination by diffraction. Section 3: Measurement techniques. Section 4:
Areas of study. Section 5: Applications