Applications of X-Ray Diffraction in Civil Engineering - Dhapekar, Nishikant K.
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X-ray diffraction is very powerful non-destructive technique for characterizing crystalline materials. It gives information on structures, phases, preferred crystal orientations and other structural parameters, like average grain size, crystalline, strain, and crystal defects. X-ray diffraction peaks are caused by constructive interference of a monochromatic beam of X-rays scattered at particular angles from each set of lattice planes during a specimen. The peak intensities are observed by the distribution of atoms within the lattice. Consequently, the X¬ray diffraction pattern is that the…mehr

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Produktbeschreibung
X-ray diffraction is very powerful non-destructive technique for characterizing crystalline materials. It gives information on structures, phases, preferred crystal orientations and other structural parameters, like average grain size, crystalline, strain, and crystal defects. X-ray diffraction peaks are caused by constructive interference of a monochromatic beam of X-rays scattered at particular angles from each set of lattice planes during a specimen. The peak intensities are observed by the distribution of atoms within the lattice. Consequently, the X¬ray diffraction pattern is that the fingerprint of periodic atomic arrangements during a given material. This review summarizes the scientific trends related to the rapid development of the technique of X-ray diffraction over the past five years concerning the fields of pharmaceuticals, forensic science, geological applications, and glass manufacturing, civil engineering, as well as in corrosion analysis.
Autorenporträt
Il dottor N. K. Dhapekar è professore assistente e responsabile del Dipartimento di Ingegneria Civile dell'Università di Kalinga, Chhattisgarh, India. Ha una ricca esperienza di insegnamento, ricerca e consulenza industriale di circa 20 anni, durante i quali ha supervisionato molti studiosi e ha svolto incarichi di consulenza offshore.