J. Patrick Meyer

Applied Measurement with jMetrik

• Gebundenes Buch

Produktbeschreibung

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

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Produktdetails

• Verlag: Routledge
• Seitenzahl: 172
• Erscheinungstermin: 27. Juni 2014
• Englisch
• Abmessung: 235mm x 157mm x 14mm
• Gewicht: 411g
• ISBN-13: 9780415531955
• ISBN-10: 0415531950
• Artikelnr.: 39294411

Autorenporträt

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

Inhaltsangabe

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item
Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5:
Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch
Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item
and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating.
References. Appendix