Applied Reliability - Tobias, Paul A; Trindade, David
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This easy-to-use guide addresses basic descriptive statistics, reliability concepts, exponential distribution, Weibull distribution, and lognormal distribution. It also covers reliability data plotting, acceleration models, life test data analysis and systems models, and much more. The third edition includes a new chapter on Bayesian reliability

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Produktbeschreibung
This easy-to-use guide addresses basic descriptive statistics, reliability concepts, exponential distribution, Weibull distribution, and lognormal distribution. It also covers reliability data plotting, acceleration models, life test data analysis and systems models, and much more. The third edition includes a new chapter on Bayesian reliability
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Autorenporträt
Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society's Lifetime Achievement Award.