Wolfgang Braun

Applied RHEED

Reflection High-Energy Electron Diffraction During Crystal Growth

• Broschiertes Buch

Produktbeschreibung

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.

Produktdetails

• Springer Tracts in Modern Physics 154
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-662-15614-8
• Softcover reprint of the original 1st ed. 1999
• Seitenzahl: 236
• Erscheinungstermin: 20. November 2013
• Englisch
• Abmessung: 235mm x 155mm x 13mm
• Gewicht: 367g
• ISBN-13: 9783662156148
• ISBN-10: 3662156148
• Artikelnr.: 39916580

Inhaltsangabe

MBE-grown semiconductor interfaces.- Reflection high-energy electron diffraction (RHEED).- RHEED oscillations.- Semikinematical simulations of RHEED patterns.- Kikuchi lines.- RHEED with rotating substrates.- Reconstruction-induced phase shifts of RHEED oscillations.- Energy loss spectroscopy during growth.- Phase shifts: Models.- Applications of reconstruction-induced phase shifts.- Closing remarks.

Rezensionen

Anyone interested in L.-M. Peng's chapter on RHEED will want to know that an entire volume on the subject has been written by W. Braun (9). This is a substantial work, full of practical detail...
Ultramicroscopy, 2001/87