Applied Scanning Probe Methods XI
Broschiertes Buch

Applied Scanning Probe Methods XI

Scanning Probe Microscopy Techniques

Herausgegeben: Bhushan, Bharat; Fuchs, Harald
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The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the n...