APPLN OF X-RAY PHOTOELECTRON SPECTROSCOPY CATALYTIC STUDIES - Spyridon Zafeiratos
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X-ray photoelectron spectroscopy (XPS) has become a standard practice technique, and automated XPS facilities can be found in industry and in universities all over the world. This transformed XPS from an advanced characterization method for dedicated research, to a rather standard analysis technique of surface analysis. The catalyst's surface state is probably the most prominent factor that influences the catalytic performance. It is therefore no surprise that XPS has become an indispensable tool in studies of solid catalysts. It has been directly used to investigate issues such as the surface…mehr

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Produktbeschreibung
X-ray photoelectron spectroscopy (XPS) has become a standard practice technique, and automated XPS facilities can be found in industry and in universities all over the world. This transformed XPS from an advanced characterization method for dedicated research, to a rather standard analysis technique of surface analysis. The catalyst's surface state is probably the most prominent factor that influences the catalytic performance. It is therefore no surprise that XPS has become an indispensable tool in studies of solid catalysts. It has been directly used to investigate issues such as the surface composition of the active catalyst and reaction and deactivation mechanisms. The objective of this book is to provide a comprehensive overview of the current status and future perspectives of X-ray photoelectron spectroscopy dedicated to catalytic applications, including thermal catalysis, electrocatalysis, and photo(electro)catalysis. The book contains 13 chapters, starting with the necessary introduction of the technique background, including basic phenomena and instrumentation aspects. The second part of the book focuses on the presentation of long-established applications of the technique, such as XPS studies of model catalysts. Finally, the book describes relatively recent developments of this method for cutting-edge surface characterization mainly using synchrotron X-ray radiation.
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