Andere Kunden interessierten sich auch für
![An Infrared Camera Simulation for Estimating Spatial Temperature Profiles and Signal-to-Noise Ratios of an Airborne Laser-Illuminated Target]( "An Infrared Camera Simulation for Estimating Spatial Temperature Profiles and Signal-to-Noise Ratios of an Airborne Laser-Illuminated Target")
An Infrared Camera Simulation for Estimating Spatial Temperature Profiles and Signal-to-Noise Ratios of an Airborne Laser-Illuminated Target61,99 €![Estimating Equatorial F-Region Daytime Vertical EXB Drift Velocities from Ground-Based Magnetometer Measurements in the Philippine Longitude Sector]( "Estimating Equatorial F-Region Daytime Vertical EXB Drift Velocities from Ground-Based Magnetometer Measurements in the Philippine Longitude Sector")
Estimating Equatorial F-Region Daytime Vertical EXB Drift Velocities from Ground-Based Magnetometer Measurements in the Philippine Longitude Sector61,99 €![Temperature and Hydrostatic Pressure Dependence of the U-center and the Far Infrared Properties of Polyamino Acids]( "Temperature and Hydrostatic Pressure Dependence of the U-center and the Far Infrared Properties of Polyamino Acids")
Temperature and Hydrostatic Pressure Dependence of the U-center and the Far Infrared Properties of Polyamino Acids61,99 €![Temperature Dependent Current-Voltage Measurements of Neutron Irradiated Al0.27ga0.73n/Gan Modulation Doped Field Effect Transistors]( "Temperature Dependent Current-Voltage Measurements of Neutron Irradiated Al0.27ga0.73n/Gan Modulation Doped Field Effect Transistors")
Temperature Dependent Current-Voltage Measurements of Neutron Irradiated Al0.27ga0.73n/Gan Modulation Doped Field Effect Transistors60,99 €![Using Time-Resolved Photoluminescence to Measure the Excitation and Temperature Dependence of Carrier Relaxation in Mid-Wave Infrared Semiconductors]( "Using Time-Resolved Photoluminescence to Measure the Excitation and Temperature Dependence of Carrier Relaxation in Mid-Wave Infrared Semiconductors")
Using Time-Resolved Photoluminescence to Measure the Excitation and Temperature Dependence of Carrier Relaxation in Mid-Wave Infrared Semiconductors60,99 €![Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements]( "Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements")
Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements60,99 €![Analysis of Uncertainties in Infrared Camera Measurements of a Turbofan Engine in an Altitude Test Cell]( "Analysis of Uncertainties in Infrared Camera Measurements of a Turbofan Engine in an Altitude Test Cell")
Analysis of Uncertainties in Infrared Camera Measurements of a Turbofan Engine in an Altitude Test Cell60,99 €
A method to recover atmospheric temperature profiles using a ground-based Fourier Transform Infrared spectrometer was investigated. The method used a difference form of the radiative transfer equation, a Bomem MR series Fourier Transform Infrared Spectrometer to collect atmospheric radiance values, and the Phillips Laboratory Expertassisted User Software (PLEXUS) atmospheric radiance model, to recover an atmospheric temperature profile. The method researched uses radiance values from both the spectrometer measurements and the atmospheric model, along with kernel functions calculated by the atmospheric model as input to a difference form of the radiation transfer equation. From this the change in brightness temperatures was determined. The method assumes that the actual brightness temperature profile is a summation of a standard or reference brightness temperature profile plus some change in the brightness temperature. The brightness temperature profile used by the atmospheric model is the reference brightness temperature profile. Planck`s Law was employed to transform the calculated brightness temperature function into a Temperature function. A temperature profile was retrieved, although significant differences existed between the recovered temperature profile and a radiosonde recovered temperature profile.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.