Baptiste Gault, Michael P. Moody, Julie M. Cairney

Atom Probe Microscopy

• Gebundenes Buch

Produktbeschreibung

This uniquely powerful microscopy technique has seen major innovations in the last decade, including pulsed-laser-assisted evaporation. As the most practical, up-to-date critical review of the field, this volume includes examples of APM from materials science.

---

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Produktdetails

• Springer Series in Materials Science 160
• Verlag: Springer / Springer New York / Springer, Berlin
• Artikelnr. des Verlages: 80096274, 978-1-4614-3435-1
• 2012
• Seitenzahl: 420
• Erscheinungstermin: 14. Mai 2012
• Englisch
• Abmessung: 241mm x 160mm x 27mm
• Gewicht: 813g
• ISBN-13: 9781461434351
• ISBN-10: 1461434351
• Artikelnr.: 34889461

Inhaltsangabe

Preface.- Acknowledgements.- List of Acronyms and Abbreviations.- List of Terms.- List of Non-SI Units and Constant Values.- PART I Fundamentals.- 1. Introduction.- 2. Field Ion Microscopy.- 3 From Field Desorption Microscopy to Atom Probe Tomography.- Part II Practical aspects.- 4. Specimen Preparation.- 5. Experimental protocols in Field Ion Microscopy.- 6. Experimental protocols.- 7. Tomographic reconstruction.- PART III Applying atom probe techniques for materials science.- 8. Analysis techniques for atom probe tomography.- 9. Atom probe microscopy and materials science.- Appendices.

Rezensionen

"Atom Probe Microscopy ... provides a much needed update on the topic and introduces the broader scientific community to this developing technique. ... this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active practitioners. The balanced delivery of instructional and reference material, in tandem with excellent graphical examples, make this book a flexible text for any atom probe laboratory." (Daniel K. Schreiber, Analytical and Bioanalytical Chemistry, Vol.407, 2015)