Atomic Force Microscopy Fundamentals and Applications - Solanki, Vanarajsinh;Dasadia, Abhay;Mishra, Pramita
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This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.

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Produktbeschreibung
This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.
Autorenporträt
Il Dr. Vanaraj Solanki ha conseguito il suo master (M.Sc) in fisica (2008) presso la S. P. University, VVNagar, e il Ph.D presso l'Institute of Physics, Bhubaneswar, India. Ha anche lavorato al Materials Research Centre, Indian Institute of Science, Bangalore, durante il suo postdoc. Attualmente, il dottor Solanki lavora come ricercatore presso KRADLE, CHARUSAT, Changa.