Wesley C Sanders

Atomic Force Microscopy

Fundamental Concepts and Laboratory Investigations

• Broschiertes Buch

Produktbeschreibung

This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.

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Produktdetails

• Verlag: Taylor & Francis Ltd (Sales)
• Seitenzahl: 139
• Erscheinungstermin: 22. Oktober 2019
• Englisch
• Abmessung: 234mm x 155mm x 10mm
• Gewicht: 227g
• ISBN-13: 9780367218645
• ISBN-10: 036721864X
• Artikelnr.: 57998672

Autorenporträt

Wesley C. Sanders is currently an assistant professor at Salt Lake Community College. He teaches courses in nanotechnology, materials science, chemistry, and microscopy. While serving as an assistant professor, he has published articles in the Journal of Chemical Education describing undergraduate labs for use in introductory, nanotechnology courses.

Inhaltsangabe

1. Introduction to Atomic Force Microscopy 2. Tip-Sample Forces 3. AFM
Electronics 4. AFM Cantilevers and Probes 5. Contact Mode AFM 6. Lateral
Force Microscopy 7. Conductive Atomic Force Microscopy 8. Oscillating Modes
of AFM 9. Image Processing