Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Herausgegeben:Cohen, Samuel H.; Lightbody, Marcia L.

• Broschiertes Buch

Produktbeschreibung

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price,Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.

Produktdetails

• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4757-9327-7
• Softcover reprint of the original 1st ed. 1997
• Seitenzahl: 264
• Erscheinungstermin: 4. Juni 2013
• Englisch
• Abmessung: 254mm x 178mm x 15mm
• Gewicht: 503g
• ISBN-13: 9781475793277
• ISBN-10: 1475793278
• Artikelnr.: 39943439

Inhaltsangabe

KEYNOTE ADDRESS: Scanned Probe Microscopy.- Semiconductor Characterization and Adsorbate Characterization.- Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspection.- Scanning Tunneling Microscopy-Based Fabrication of Nanometer Scale Structures.- A Microscopy for Our Time.- Scanning Tunneling Microscopy of Chemical Vapor Deposition Diamond Film Growth on Highly Oriented Pyrolytic Graphite and Silicon.- Scanning Tunneling Microscopy and Atomic Force Microscopy of Chemical-Vapor-Deposition Diamond and Diamond-Like Carbon Thin Films.- Atomic Resolution Ultrahigh Vacuum Scanning Tunneling Microscopy of Diamond (100) Epitaxial Films.- Scanning Force Microscopy Characterization of Biopolymer Films: Gelatin on Mica.- Gasification Studies of Graphite Surface by Scanning Tunneling Microscopy.- Scanning Tunneling Microscopy Studies of Hydrocarbons Adsorbed on Graphite Surfaces.- Biological and Chemical Nanostructure.- Visualization of the Surface Degradation of Biomedical Polymers in Situ with an Atomic Force Microscope.- Scanning Tunneling Microscopy Investigations on Heteroepitaxially Grown Overlayers of Cu-phthalocyanine On Au(111) Surfaces.- Characterization of Poly(tetrafluoroethylene) Surfaces by Atomic Force Microscopy-Results and Artifacts.- Scanning Probe Microscopy Studies of Isocyanide Functionalized Polyaniline Thin Films.- New Developments in AFM/STM.- Investigations on the Topographic and Spectroscopic Imaging by the Scanning Tunneling Microscope.- Observing Reactions via Flow Injection Scanning Tunneling Microscopy.- Advances in Piezoresistive Cantilevers for Atomic Force Microscopy.- Nanometer-Scale Qualitative Analysis of Surfaces with a Modified Scanning Tunneling Microscope/Field Emission Source.- Atomic Force Microscopy Imaging ofSingle Ion Impacts on Mica.- AFM/STM in Materials Science.- Applications of Atomic Force Microscopy in Optical Fiber Research.- Atomic Force Microscopy Studies on Optical Fibers.- Scanning Tunneling Microscopy Studies of Solvent-Deposited Materials on Highly Oriented Pyrolytic Graphite.- In Situ Study of Stainless Steel's Passive Layer Exposed to HC1 Using a Scanning Tunneling Microscope.- Application of Magnetic Force Microscopy in Magnetic Recording.- Scanning Electron Microscopy, Scanning Tunneling Microscopy, and Atomic Force Microscopy Studies of Selected Videotapes.- Surface Characteristics Evaluation of Thin Films byAtomic Force Microscopy.- Current versus Voltage Characteristics for Deposition and Removal of Gold Nanostructures on a Gold Surface Using Scanning Tunneling Microscopy.- Atomic Force Microscopy of Ion-Beam Modified Carbon Fibers.