Challenges in Mechanics of Time-Dependent Materials & Mechanics of Biological Systems and Materials, Volume 2

Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics
Herausgegeben:Amirkhizi, Alireza; Furmanski, Jevan; Franck, Christian; Kasza, Karen; Forster, Aaron; Estrada, Jon

• Gebundenes Buch

Produktbeschreibung

Challenges in Mechanics of Time-Dependent Materials & Mechanics of Biological Systems and Materials, Volume 2 of the Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the second volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on fundamental and applied aspects of Experimental Mechanics, including papers in the following general technical research areas:

Characterization Across Length Scales

Extreme Conditions & Environmental Effects

Damage, Fatigue and Fracture

Structure, Function and Performance

Rate Effects in Elastomers

Viscoelasticity & Viscoplasticity

Research in Progress

Cellular Biomechanics and Mechanobiology

Biofilms and Microbe Mechanics

Traumatic Brain Injury

Cardiac and Vascular Biomechanics

Orthopedic and Disease Biomechanics

Time Dependence of Biomaterials

Experimental Techniques in Biological and Biomimetic Systems

Produktdetails

• Conference Proceedings of the Society for Experimental Mechanics Series
• Verlag: Springer / Springer International Publishing / Springer, Berlin
• Artikelnr. des Verlages: 978-3-031-17456-8
• 1st ed. 2023
• Seitenzahl: 96
• Erscheinungstermin: 22. November 2022
• Englisch
• Abmessung: 285mm x 215mm x 12mm
• Gewicht: 510g
• ISBN-13: 9783031174568
• ISBN-10: 3031174569
• Artikelnr.: 65313181

Autorenporträt

Alireza  Amirkhizi University of Massachusetts- Lowell , USA; Jevan Furmanski, University of Dayton Research Institute, USA; Christian Franck, University of Wisconsin-MAdison, USA; Karen Kasza, Columbia University, USA; Aaron Forster, National Institute of Standards and Technology, USA;Jon Estrada, University of Michigan, MI, USA