A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
List of contributors; Preface; 1. High-resolution transmission electron microscopy S. Horiuchi and L. He; 2. Holography in the transmission electron microscope A. Tonomura; 3. Microanalysis by scanning transmission electron microscopy L. M. Brown and J. Yuan; 4. Specimen preparation for transmission electron microscopy J. G. Wen; 5. Low-temperature scanning electron microscopy R. P. Huebener; 6. Scanning tunneling microscopy M. E. Hawley; 7. Identification of new superconducting compounds by electron microscopy G. Van Tendeloo and T. Krekels; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors Y. Y. Wang and V. P. Dravid; 9. Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7 Y. Zhu; 10. Grain boundaries in high Tc materials: transport properties and structure K. L. Merkle, Y. Gao and B. V. Vuchic; 11. The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7-d N. D. Browning, M. F. Chisholm and S. J. Pennycook; 12. Microstructures in superconducting YBa2Cu3O7 thin films A. F. Marshall; 13. Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy C. L. Jia and K. Urban; 14. Controlling the structure and properties of high Tc thin-film devices E. Olsson.
List of contributors; Preface; 1. High-resolution transmission electron microscopy S. Horiuchi and L. He; 2. Holography in the transmission electron microscope A. Tonomura; 3. Microanalysis by scanning transmission electron microscopy L. M. Brown and J. Yuan; 4. Specimen preparation for transmission electron microscopy J. G. Wen; 5. Low-temperature scanning electron microscopy R. P. Huebener; 6. Scanning tunneling microscopy M. E. Hawley; 7. Identification of new superconducting compounds by electron microscopy G. Van Tendeloo and T. Krekels; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors Y. Y. Wang and V. P. Dravid; 9. Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7 Y. Zhu; 10. Grain boundaries in high Tc materials: transport properties and structure K. L. Merkle, Y. Gao and B. V. Vuchic; 11. The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7-d N. D. Browning, M. F. Chisholm and S. J. Pennycook; 12. Microstructures in superconducting YBa2Cu3O7 thin films A. F. Marshall; 13. Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy C. L. Jia and K. Urban; 14. Controlling the structure and properties of high Tc thin-film devices E. Olsson.
Es gelten unsere Allgemeinen Geschäftsbedingungen: www.buecher.de/agb
Impressum
www.buecher.de ist ein Shop der buecher.de GmbH & Co. KG i.I. Bürgermeister-Wegele-Str. 12, 86167 Augsburg Amtsgericht Augsburg HRA 13309
