Characterization of Integrated Bragg Gratings In Silicon-on-Insulator - Tashtush, Aktham
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Silicon-on-insulator (SOI) is rapidly emerging as a very promising material platform for integrated photonics. As it combines the potential for optoelectronic integration with the low-cost and large volume manufacturing capabilities and they are already accumulate a huge amount of applications in areas like sensing, quantum optics, optical telecommunications and metrology. One of the main limitations of current technology is that waveguide propagation losses are still much higher than in standard glass-based platform because of many reasons such as bends, surface roughness and the very strong…mehr

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Produktbeschreibung
Silicon-on-insulator (SOI) is rapidly emerging as a very promising material platform for integrated photonics. As it combines the potential for optoelectronic integration with the low-cost and large volume manufacturing capabilities and they are already accumulate a huge amount of applications in areas like sensing, quantum optics, optical telecommunications and metrology. One of the main limitations of current technology is that waveguide propagation losses are still much higher than in standard glass-based platform because of many reasons such as bends, surface roughness and the very strong optical confinement provided by SOI. Such high loss prevents the fabrication of efficient optical resonators and complex devices severely limiting the current potential of the SOI platform.
Autorenporträt
Throughout the experience as Researcher the opportunity to build up the knowledge of the basics and develop keen thinking mixed with The vibrant and competitive environment of nurture coupled with the high emphasis given to Applied Science at many institutes have predisposed me to pursue higher studies in Telecom Engineering & integrated Photonics.