Characterization of Minerals, Metals, and Materials 2025
226,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in 1-2 Wochen
payback
113 °P sammeln
  • Gebundenes Buch

The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but are not limited to: Extraction and processing of various types of minerals, process-structure-property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materialsNovel methods and techniques for characterizing materials…mehr

Andere Kunden interessierten sich auch für
Produktbeschreibung
The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but are not limited to:
Extraction and processing of various types of minerals, process-structure-property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materialsNovel methods and techniques for characterizing materials across a spectrum of systems and processesCharacterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of metals, polymers, and ceramics including battery materials Characterization of structural, morphological, and topographical natures of materials at micro- and nano-scales Characterization of extraction and processing including process development and analysis Advances in instrument development for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques 2D and 3D modelling for materials characterization
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Autorenporträt
Zhiwei Peng, Central South University, Changsha, China; Kelvin Yu Xie, Texas A&M University, College Station, TX, USA; Mingming Zhang, Baowu Ouyeel Co. Ltd., Schererville, IN, USA; Jian Li, CanmetMATERIALS, Hamilton, ON, Canada; Bowen Li, Michigan Technological University, Houghton, MI, USA; Sergio Neves Monteiro, Military Institute of Engineering, Rio de Janeiro, Brazil; Rajiv Soman, AnalytiChem Group, West Chester, OH, USA; Jiann-Yang Hwang, Michigan Technological University, Houghton, MI, USA; Yunus Eren Kalay, Middle East Technical University, Ankara, Turkey; Juan P. Escobedo-Diaz, University of New South Wales, Canberra, ACT, Australia; John S. Carpenter, Los Alamos National Laboratory, Los Alamos, NM, USA; Andrew D. Brown, DEVCOM ARL Army Research Office, Burlington, NC, USA; Shadia Ikhmayies, University of Jordan, Amman, Jordan.