Sverre Myhra, John C Rivière

Characterization of Nanostructures

• Broschiertes Buch

Produktbeschreibung

Divided into two parts, this book provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures and discusses typical applications to single nanoscale objects, as well as ensembles of such objects. The authors focus on the needs in the research laboratory but also address the needs of quality control, industrial troubleshooting, and online analysis. They describe operational modes most relevant to nanoscale characterization, and offer unique content on systems of different dimensionalities and functionalities.

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Produktdetails

• Verlag: Taylor & Francis Ltd (Sales)
• Seitenzahl: 366
• Erscheinungstermin: 26. Oktober 2016
• Englisch
• Abmessung: 234mm x 156mm x 19mm
• Gewicht: 494g
• ISBN-13: 9781138198630
• ISBN-10: 1138198633
• Artikelnr.: 57051639

Autorenporträt

Sverre Myhra and John Riviere are affiliated with Oxford University, UK.

Inhaltsangabe

Introduction to Characterization of Nanostructures. Techniques and Methods:
Electron-Optical Imaging of Nanostructures ((HR)TEM, STEM, and SEM).
Electron-Optical Analytical Techniques. Photon-Optical Spectroscopy-Raman
and Fluorescence. Scanning Probe Techniques and Methods. Techniques and
Methods for Nanoscale Analysis of Single C60 and Other Cage Structures.
Applications: Quantum Dots and Related Structures. Carbon Nanotubes and
Other Tube Structures. Nanowires. Graphene and Other Monolayer Structures.
Nanostructures-Strategic and Tactical Issues.