Andrei Pavlov, Manoj Sachdev

CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware Sram Design and Test

• Gebundenes Buch

Produktbeschreibung

This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

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Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.

Produktdetails

• Frontiers in Electronic Testing 40
• Verlag: Springer / Springer Netherlands
• Artikelnr. des Verlages: 11681229, 978-1-4020-8362-4
• 2008 edition
• Seitenzahl: 194
• Erscheinungstermin: 21. Juni 2008
• Englisch
• Abmessung: 242mm x 166mm x 19mm
• Gewicht: 476g
• ISBN-13: 9781402083624
• ISBN-10: 1402083629
• Artikelnr.: 23539913

Autorenporträt

Prof. Sachdev has authored several successful books with Springer

Inhaltsangabe

and Motivation.- SRAM Circuit Design and Operation.- SRAM Cell Stability: Definition, Modeling and Testing.- Traditional SRAM Fault Models and Test Practices.- Techniques for Detection of SRAM Cells with Stability Faults.- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.