Andrei Pavlov, Manoj Sachdev

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Process-Aware SRAM Design and Test

• Broschiertes Buch

Produktbeschreibung

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Produktdetails

• Frontiers in Electronic Testing 40
• Verlag: Springer / Springer Netherlands
• Artikelnr. des Verlages: 978-90-481-7855-1
• Softcover reprint of hardcover 1st ed. 2008
• Seitenzahl: 212
• Erscheinungstermin: 28. Oktober 2010
• Englisch
• Abmessung: 235mm x 155mm x 12mm
• Gewicht: 330g
• ISBN-13: 9789048178551
• ISBN-10: 904817855X
• Artikelnr.: 32108731

Autorenporträt

Prof. Sachdev has authored several successful books with Springer

Inhaltsangabe

and Motivation.- SRAM Circuit Design and Operation.- SRAM Cell Stability: Definition, Modeling and Testing.- Traditional SRAM Fault Models and Test Practices.- Techniques for Detection of SRAM Cells with Stability Faults.- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.