Balasubramanian Muralikrishnan, Jayaraman Raja

Computational Surface and Roundness Metrology

• Broschiertes Buch

Produktbeschreibung

"Computational Surface and Roundness Metrology" provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, this book describes it all (in exhaustive detail). From the graduate student of metrology to the practicing engineer on the shop floor, this book is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics.

Produktdetails

• Verlag: Springer / Springer London / Springer, Berlin
• Artikelnr. des Verlages: 978-1-84996-773-0
• Softcover reprint of hardcover 1st ed. 2009
• Seitenzahl: 284
• Erscheinungstermin: 13. Oktober 2010
• Englisch
• Abmessung: 235mm x 155mm x 16mm
• Gewicht: 431g
• ISBN-13: 9781849967730
• ISBN-10: 1849967733
• Artikelnr.: 32655135

Autorenporträt

Bala Muralikrishnan has a PhD in Mechanical Engineering from the University of North Carolina at Charlotte, USA. He works for the National Institute of Standards and Technology, where he is a guest researcher in the Engineering Metrology Group of the Precision Engineering Division - one of the divisions of the Manufacturing Engineering Laboratory. Jayaraman Raja has a PhD in Mechanical Engineering from the Indian Institute of Technology, Madras, India. He is a professor and chairman in the Department of Mechanical Engineering & Engineering Science at the University of North Carolina at Charlotte, USA. His research interests include Surface & Form Metrology; Computational Metrology; and Precision Engineering.

Inhaltsangabe

Filtering.- A Brief History of Filtering.- Filtering in the Frequency Domain.- Filtering in the Time Domain.- Gaussian Filter.- The 2RC Filter.- Filtering Roundness Profiles.- Filtering 3D Surfaces.- Advanced Filtering.- Gaussian Regression Filters.- Spline Filter.- Robust Filters.- Envelope and Morphological Filters.- Multi-scale Filtering.- Fitting.- to Fitting Substitute Geometry.- Least-Squares Best-Fit Line and Plane.- Non-linear Least-Squares I: Introduction.- Non-linear Least-Squares II: Circle, Sphere, and Cylinder.- Fitting Radius-Suppressed Circle Data.- Exchange Algorithms for Minimum Zone.- Reference Circle-Fitting Using Linear Programming Simplex.- Parameterization.- Surface Finish Parameters I: Amplitude, Spacing, Hybrid, and Shape.- Surface Finish Parameters II: Autocorrelation, Power Spectral Density, Bearing Area.- 3D Surface Texture Parameters.- Errors and Uncertainty.- Uncertainty Considerations.- Uncertainty Propagation in Computations.- Error Separation Techniques in Roundness Metrology.- Other Relevant Topics.

Rezensionen

Computational Surface and Roundness Metrology can be used for final-year undergraduate engineering courses (for example, manufacturing, mechanical, etc.) or as a subject on manufacturing at postgraduate level. Also, this book can serve as a useful reference for academics, manufacturing researchers, mechanical and manufacturing engineers, and professionals in related industries with manufacturing, quality, and surface and roundness metrology.

J. Paul Davim (from the International Journal of Mechatronics and Manufacturing Systems)

Computational Surface and Roundness Metrology can be used for final-year undergraduate engineering courses (for example, manufacturing, mechanical, etc.) or as a subject on manufacturing at postgraduate level. Also, this book can serve as a useful reference for academics, manufacturing researchers, mechanical and manufacturing engineers, and professionals in related industries with manufacturing, quality, and surface and roundness metrology.

J. Paul Davim (from the International Journal of Mechatronics and Manufacturing Systems)