Produktbild: Computer Modelling of Electronic and Atomic Processes in Solids
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Computer Modelling of Electronic and Atomic Processes in Solids

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

14.10.2012

Abbildungen

XVII, 341 p.

Herausgeber

R.C. Tennyson + weitere

Verlag

Springer Netherland

Seitenzahl

341

Maße (L/B/H)

24/16/2 cm

Gewicht

581 g

Auflage

Softcover reprint of the original 1st ed. 1997

Sprache

Englisch

ISBN

978-94-010-6387-6

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

14.10.2012

Abbildungen

XVII, 341 p.

Herausgeber

Verlag

Springer Netherland

Seitenzahl

341

Maße (L/B/H)

24/16/2 cm

Gewicht

581 g

Auflage

Softcover reprint of the original 1st ed. 1997

Sprache

Englisch

ISBN

978-94-010-6387-6

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: ProductSafety@springernature.com

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  • Produktbild: Computer Modelling of Electronic and Atomic Processes in Solids
  • Atomic and Molecular Processes.- [1] New Mechanisms of Radiation Defect Creation in Space Conditions.- [2] Computer Simulation of Catalytic Systems.- [3] Application of Green-Function Method to Molecular Systems.- [4] Computer Simulation of HTSC Structures and Processes.- [5] Semi-Empirical Simulation of Radiation Defects in Oxide Materials.- [6] Cluster Model in Surface Science.- [7] Modeling of Inhomogeneity in Solid Coatings Obtained from Water Suspensions.- [8] Quantum Mechanical Simulations in Semiconductor Materials Science: The Tight-Binding Molecular Dynamics Approach.- [9] Molecular Dynamics Study of Self-Organization of Polymer Liquid Crystals.- [10] Molecular Dynamics Study of Self-Organization and Compression of an Amorphous Polymer.- [11] Modeling Non-Metal Surface Damage Created by Multiply-Charged Ions.- [12] Modelling of Local Centres of Icosahedral Symmetry in Solids and Fullerenes.- [13] Modelling Structure and Defects in Zeolites.- [14] The Nature of a Photoinduced Metastable State in ?-SI:H.- [15] The Molecular Dynamics Simulation of Contact Melting: Four-Component Ionic Systems.- [16] The Molecular Dynamics Simulation of Interactions in Shock-Compressed Systems.- Electronic Structure and Processes.- [17] Combined Density Functional and Configuration Interaction Method for the Electronic Structure of Solids with Impurities.- [18] Configurations of Point Defects in Silicon Under Critical Concentrations.- [19] Hybrid Quantum-Mechanical and Potential Models for Studies in Solids.- [20] Mechanisms of Destruction of Solid Surfaces Induced by Electron Excitations.- [21] New Method of Computer Simulation of Defect Configurations in Semiconductors.- [22] Computer Modelling of Dielectric Properties of Composite Materials.- [23] Simulation of RecombinationProcesses in Porous Silicon.- [24] Quantum Mechanical Modelling of Exciton and Hole Self-Trapping in Ionic Crystals.- [25] Correlation between Electronic Structure and Atomic Configurations in Disordered Solids.- Structure and Properties.- [26] Monte Carlo Computational Techniques for Prediction of Atomic Oxygen Erosion of Materials.- [27] Structural Models of Photosensitivity of Polycrystal Films.- [28] Predictive Models of Erosion Processes in LEO Space Environment: A Basis for Development of an Engineering Software.- [29] Computer Simulation and Experimental Studies of Ion Implantation in Polymers for Erosion Resistance Improvement.- [30] Computer Modelling of the Anomalous Ultrasound Attenuation in Glasses.- [31] The Fractal Models of Defects Growth in Solids.- [32] Computer Model for M/OD Impact Damage Assesment on Spacecraft Materials.- Appendix A: Organizing Committees International Organizing Committee Local Organizing Committee.- Appendix B: Workshop Lecturers.