Holm Altenbach / Jacek J. Skrzypek (eds.)

Creep and Damage in Materials and Structures

Herausgegeben:Altenbach, Holm; Skrzypek, Jacek J.

• Broschiertes Buch

Produktbeschreibung

This textbook gives a concise survey of constitutive and structural modeling for high temperature creep, damage, low - cycle fatigue and other inelastic conditions. The book shows the creep and continuum damage mechanics as rapidly developing discipline which interlinks the material science foundations, the constitutive modeling and computer simulation application to analysis and design of simple engineering components. It is addressed to young researchers and scientists working in the field of mechanics of inelastic, time-dependent materials and structures, as well as to PhD students in computational mechanics, material sciences, mechanical and civil engineering.

Produktdetails

• CISM International Centre for Mechanical Sciences 399
• Verlag: Springer / Springer Vienna / Springer, Wien
• Artikelnr. des Verlages: 978-3-211-83321-6
• 1999
• Seitenzahl: 360
• Erscheinungstermin: 22. November 1999
• Englisch
• Abmessung: 244mm x 170mm x 20mm
• Gewicht: 620g
• ISBN-13: 9783211833216
• ISBN-10: 3211833218
• Artikelnr.: 24521233

Autorenporträt

Prof. Dr.-Ing. habil. Holm Altenbach lehrt Technische Mechanik an der Otto-von-Guericke-Universität Magdeburg. Seine Forschungsschwerpunkte liegen auf verschiedenen Gebieten der Kontinuumsmechanik (Plattentheorie, Kriechschädigungsmechanik, Mechanik der Komposite).

Inhaltsangabe

General Constitutive Equations for Simple and Non-Simple Materials (P. R. Gummert).- Classical and Non-Classical Creep Models (H. Altenbach).- Material Damage Models for Creep Failure Analysis and Design of Structures (J. J. Skrzypek).- Materials Data Bases and Mechanisms-Based Constitutive Equations for Use in Design (D. R. Hayhurst).- Thermodynamically Founded CDM Models for Creep and other Conditions (J.-L. Chaboche).- Creep Plasticity Interaction (E. Krempl).- The Standard Linear Solid as a Basis for VBO.- Modeling of Rate-Independence and of Negative Rate Sensitivity.