The factory scheduling problem, that of allocating machines to competing jobs in manufacturing facilities to optimize or at least improve system performance, is encountered in many different manufacturing environments. Given the competitive pressures faced by many companies in today's rapidly changing global markets, improved factory scheduling should contribute to a flrm's success. However, even though an extensive body of research on scheduling models has been in existence for at least the last three decades, most of the techniques currently in use in industry are relatively simplistic, and…mehr
The factory scheduling problem, that of allocating machines to competing jobs in manufacturing facilities to optimize or at least improve system performance, is encountered in many different manufacturing environments. Given the competitive pressures faced by many companies in today's rapidly changing global markets, improved factory scheduling should contribute to a flrm's success. However, even though an extensive body of research on scheduling models has been in existence for at least the last three decades, most of the techniques currently in use in industry are relatively simplistic, and have not made use of this body of knowledge. In this book we describe a systematic, long-term research effort aimed at developing effective scheduling algorithms for complex manufacturing facilities. We focus on a speciflc industrial context, that of semiconductor manufacturing, and try to combine knowledge of the physical production system with the methods and results of scheduling researchto develop effective approximate solution procedures for these problems. The class of methods we suggest, decomposition methods, constitute a broad family of heuristic approaches to large, NP-hard scheduling problems which can be applied in other environments in addition to those studied in this book.
1 Introduction.- 1.1 Introduction.- 1.2 The Scheduling Problem in the Organization.- 1.3 The Nature of the Factory Scheduling Problem.- 1.4 Deterministic Formulation of the Factory Scheduling.- Problem.- 1.5 Outline of Book.- 2 Industrial Context and Motivation for Decomposition Methods.- 2.1 Introduction.- 2.2 Semiconductor Manufacturing.- 2.3 Formulation as a Job Shop Scheduling Problem.- 2.4 Decomposition Methods.- 2.5 Summary.- 3 Review of Decomposition Methods for Factory Scheduling Problems.- 3.1 Introduction.- 3.2 A Taxonomy of Decomposition Methods for Factory 31 Scheduling Problems.- 3.3 Temporal Decomposition Schemes.- 3.4 Entity Decomposition Schemes.- 3.5 Hybrid Decomposition Schemes.- 3.6 Discussion.- 3.7 Conclusions.- 4 Modelling Interactions Between Subproblems: the Disjunctive Graph Representation and Extensions.- 4.1 Introduction.- 4.2 Disjunctive Graph Representation of the Classical Job Shop 48 Problem.- 4.3 Delayed Precedence Constraints.- 4.4 Extensions to Disjunctive Graph Representation.- 4.5 Summary.- 5 Workcenter-Based Decomposition Procedures for The Classical Job Shop Environment.- 5.1 Introduction.- 5.2 The Shifting Bottleneck Procedure.- 5.3 Dispatching Rules Used in Experiments.- 5.4 Results for Benchmark J//Cmax Problems.- 5.5 Results for Small Job Shop Problems.- 5.6 Results for Large Problems.- 5.7 Evaluation of Shifting Bottleneck using Other Performance.- Measures.- 5.8 Summary.- 6 A Generic Decomposition Procedure for Semiconductor Testing Facilities.- 6.1 Introduction.- 6.2 The Generic Decomposition Procedure.- 6.3 Computational Experiments.- 6.4 Results.- 6.5 Conclusions.- 7 Time-Based Decomposition Procedures for Single-Machine Subproblems with Sequence-Dependent Setup Times.- 7.1 Introduction.- 7.2 Previous Related Work.- 7.3 Rolling Horizon Procedures.- 7.4 Branch and Bound Algorithm.- 7.5 Experimental Design.- 7.6 Results.- 7.7 Conclusions.- 8 Time-Based Decomposition Procedures for Parallel Machine Subproblems with Sequence-Dependent Setup Times.- 8.1 Introduction.- 8.2 Previous Related Work.- 8.3 Rolling Horizon Procedures for Parallel Machines.- 8.4 Use of RHP to Improve on LIST(EDD).- 8.5 Computational Experiments.- 8.6 Results.- 8.7 Conclusions and Future Directions.- 9 Naive Rolling Horizon Procedures for Job Shop Scheduling.- 9.1 Introduction.- 9.2 Scheduling Approach.- 9.3 Implementation and Computational Experiments.- 9.4 Results.- 9.5 Summary and Conclusions.- 10 Tailored Decomposition Procedures for Semiconductor Testing Facilities.- 10.1 Introduction.- 10.2 Subproblem Formulations.- 10.3 Modifications to the Rolling Horizon Procedures.- 10.4 Local Search Procedures for Single and Parallel Machine.- Problems.- 10.5 Operation-Based Decomposition.- 10.6 Tailored Control Structures for Semiconductor Testing.- Facilities.- 10.7 Summary.- 11. Computational Results for Job Shops with Single and Parallel Machine Workcenters.- 11.1 Introduction.- 11.2 Algorithms Compared in Experiments.- 11.3 Results for Shops with Single Machine Workcenters.- 11.4 Results for Shops with Parallel Machine Workcenters.- 11.5 Conclusions.- 12 The Effects of Subproblem Solution Procedures and Control Structures.- 12.1 Introduction.- 12.2 Two Additional Decomposition Procedures.- 12.3 Results for Semiconductor Testing Problems.- 12.4 Results for Reentrant Flow Shops.- 12.5 Summary and Conclusions.- 13 Conclusions and Future Directions.- 13.1 Introduction.- 13.2 Summary.- 13.3 Conclusions and Future Directions.- Author Index.
1 Introduction.- 1.1 Introduction.- 1.2 The Scheduling Problem in the Organization.- 1.3 The Nature of the Factory Scheduling Problem.- 1.4 Deterministic Formulation of the Factory Scheduling.- Problem.- 1.5 Outline of Book.- 2 Industrial Context and Motivation for Decomposition Methods.- 2.1 Introduction.- 2.2 Semiconductor Manufacturing.- 2.3 Formulation as a Job Shop Scheduling Problem.- 2.4 Decomposition Methods.- 2.5 Summary.- 3 Review of Decomposition Methods for Factory Scheduling Problems.- 3.1 Introduction.- 3.2 A Taxonomy of Decomposition Methods for Factory 31 Scheduling Problems.- 3.3 Temporal Decomposition Schemes.- 3.4 Entity Decomposition Schemes.- 3.5 Hybrid Decomposition Schemes.- 3.6 Discussion.- 3.7 Conclusions.- 4 Modelling Interactions Between Subproblems: the Disjunctive Graph Representation and Extensions.- 4.1 Introduction.- 4.2 Disjunctive Graph Representation of the Classical Job Shop 48 Problem.- 4.3 Delayed Precedence Constraints.- 4.4 Extensions to Disjunctive Graph Representation.- 4.5 Summary.- 5 Workcenter-Based Decomposition Procedures for The Classical Job Shop Environment.- 5.1 Introduction.- 5.2 The Shifting Bottleneck Procedure.- 5.3 Dispatching Rules Used in Experiments.- 5.4 Results for Benchmark J//Cmax Problems.- 5.5 Results for Small Job Shop Problems.- 5.6 Results for Large Problems.- 5.7 Evaluation of Shifting Bottleneck using Other Performance.- Measures.- 5.8 Summary.- 6 A Generic Decomposition Procedure for Semiconductor Testing Facilities.- 6.1 Introduction.- 6.2 The Generic Decomposition Procedure.- 6.3 Computational Experiments.- 6.4 Results.- 6.5 Conclusions.- 7 Time-Based Decomposition Procedures for Single-Machine Subproblems with Sequence-Dependent Setup Times.- 7.1 Introduction.- 7.2 Previous Related Work.- 7.3 Rolling Horizon Procedures.- 7.4 Branch and Bound Algorithm.- 7.5 Experimental Design.- 7.6 Results.- 7.7 Conclusions.- 8 Time-Based Decomposition Procedures for Parallel Machine Subproblems with Sequence-Dependent Setup Times.- 8.1 Introduction.- 8.2 Previous Related Work.- 8.3 Rolling Horizon Procedures for Parallel Machines.- 8.4 Use of RHP to Improve on LIST(EDD).- 8.5 Computational Experiments.- 8.6 Results.- 8.7 Conclusions and Future Directions.- 9 Naive Rolling Horizon Procedures for Job Shop Scheduling.- 9.1 Introduction.- 9.2 Scheduling Approach.- 9.3 Implementation and Computational Experiments.- 9.4 Results.- 9.5 Summary and Conclusions.- 10 Tailored Decomposition Procedures for Semiconductor Testing Facilities.- 10.1 Introduction.- 10.2 Subproblem Formulations.- 10.3 Modifications to the Rolling Horizon Procedures.- 10.4 Local Search Procedures for Single and Parallel Machine.- Problems.- 10.5 Operation-Based Decomposition.- 10.6 Tailored Control Structures for Semiconductor Testing.- Facilities.- 10.7 Summary.- 11. Computational Results for Job Shops with Single and Parallel Machine Workcenters.- 11.1 Introduction.- 11.2 Algorithms Compared in Experiments.- 11.3 Results for Shops with Single Machine Workcenters.- 11.4 Results for Shops with Parallel Machine Workcenters.- 11.5 Conclusions.- 12 The Effects of Subproblem Solution Procedures and Control Structures.- 12.1 Introduction.- 12.2 Two Additional Decomposition Procedures.- 12.3 Results for Semiconductor Testing Problems.- 12.4 Results for Reentrant Flow Shops.- 12.5 Summary and Conclusions.- 13 Conclusions and Future Directions.- 13.1 Introduction.- 13.2 Summary.- 13.3 Conclusions and Future Directions.- Author Index.
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