K. Sumino

Defect Control in Semiconductors: Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors The Yokohama 21st Century Forum Yokohama, Japan, September 17-22, 1989 (2 vols.set/ 2 Bände KOMPLETT)

• Buch

Produktdetails

• Verlag: Elsevier Science Ltd.
• ISBN-13: 9780444884299
• Artikelnr.: 28068618