125,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in 6-10 Tagen
payback
63 °P sammeln
  • Broschiertes Buch

This book describes how reliability can be embedded into the product development using a design methodology that uses parametric accelerated lifecycle testing (ALT) .
The book has these features:
- A new reliability methodology, based on inferential statistics, that can determine whether the reliability of a mechanical/civil system is achieved.
- A unique reliability methodology to prevent reliability disasters in new mechanical products in the field, e.g., automobiles and airplanes.
- Robust design methodology of mechanical/civil product to withstand a variety of loads.
-
…mehr

Produktbeschreibung
This book describes how reliability can be embedded into the product development using a design methodology that uses parametric accelerated lifecycle testing (ALT) .

The book has these features:

- A new reliability methodology, based on inferential statistics, that can determine whether the reliability of a mechanical/civil system is achieved.

- A unique reliability methodology to prevent reliability disasters in new mechanical products in the field, e.g., automobiles and airplanes.

- Robust design methodology of mechanical/civil product to withstand a variety of loads.

- Explanation of an alternative experimental Taguchi methodology.

- Discussion of how parametric ALT can alsobe used to predict product reliability-lifetime and failure rate.

- Detailed case studies that demonstrate parametric ALT methodology.

This book will be useful for senior-level undergraduate and graduate students, professional engineers, college and university-level lecturers, researchers, and design managers in mechanical and civil engineering.

Autorenporträt
Seongwoo Woo has a B.S. and an M.S. in Mechanical Engineering, and he has gained a PhD in Mechanical Engineering from Texas A&M. His major interests are in energy systems such as HVAC and its heat transfer, optimal design and control of refrigerators, reliability design of mechanical components, and failure analysis of thermal components in marketplace using nondestructive methods such as scanning electron microscopy and X-ray. In particular, he has developed parametric accelerating life testing (ALT) as a new reliability methodology, which would determine if there is a design fault in a mechanical system that is subjected to repetitive stress. Using this parametric ALT, engineers can find the design faults before the product is launched and thus can avoid failures. From 1992 to 1997, he worked in the Agency for Defense Development, Chinhae, South Korea, where he was the researcher in charge of the Development of Naval Weapon System. From 2000 to 2010, he worked asa senior reliability engineer in Side-by-Side Refrigerator Division, Digital Appliance, Samsung Electronics, where he focused on enhancing the lifetime of refrigerators using a parametric ALT. Now, he is working as a professor in the Mechanical Department, Ethiopian Technical University.