Nicht lieferbar
Designer's Guide to Testable ASIC Devices - Needham, Wayne M.
Schade – dieser Artikel ist leider ausverkauft. Sobald wir wissen, ob und wann der Artikel wieder verfügbar ist, informieren wir Sie an dieser Stelle.
  • Gebundenes Buch

While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o

Produktbeschreibung
While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o