Miron Abramovici, Melvin A Breuer, Arthur D Friedman

Digital Systems Testing and Testable Design

• Gebundenes Buch

Produktbeschreibung

This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design. Considered a definitive text in this area, the book includes in-depth discussions of the following topics: Test generation Fault modeling for classic and new technologies Simulation Fault simulation Design for testability Built-in self-test Diagnosis All topics are covered extensively, from fundamental concepts to advanced techniques. Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.

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Produktdetails

• Verlag: Wiley
• Revised edition
• Seitenzahl: 672
• Erscheinungstermin: 27. September 1994
• Englisch
• Abmessung: 260mm x 183mm x 40mm
• Gewicht: 1440g
• ISBN-13: 9780780310629
• ISBN-10: 0780310624
• Artikelnr.: 21359033

Autorenporträt

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago. Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles. Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University. All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.

Inhaltsangabe

Preface.
How This Book Was Written.
Introduction.
Modeling.
Logic Simulation.
Fault Modeling.
Fault Simulation.
Testing For Single Stuck Faults.
Testing For Bridging Faults.
Functional Testing.
Design For Testability.
Compression Techniques.
Built-In Self-Test.
Logic-Level Diagnosis.
Self-Checking Design.
PLA Testing.
System-Level Diagnosis.
Index.