This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists, and researchers. This book aims to give both the technician and the academic researcher in the field a thorough understanding of both the mathematical principles and uses, and their applications.
This book provides in-depth coverage of metrology principles for students, practicing engineers, technologists, and researchers. This book aims to give both the technician and the academic researcher in the field a thorough understanding of both the mathematical principles and uses, and their applications.Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Han Haitjema is emeritus professor at the KU Leuven, Belgium, and metrologist at Mitutoyo Europe. Prior to these positions, he was director of Mitutoyo Research Center Europe, assistant professor at the TU-Eindhoven in the Precision Engineering group of Professor Schellekens, and scientist, covering dimensional metrology, at the VSL, the National Metrology Institute of the Netherlands. He loves dimensional metrology in all its aspects, from fundamental physics to quality control, and the application of mathematical and basic principles to new and existing calibration methods. He is a fellow of CIRP, a member of the board of experts for the Dutch national standards, and editor-in-chief of the journal 'Metrology.' Richard Leach is a professor in metrology at the University of Nottingham and grew the Manufacturing Metrology Team. Prior to this position, he was at the National Physical Laboratory from 1990 to 2014. His primary love is instrument building, from concept to ¿nal installation, and his current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, development of methods for measuring 3D structures, uncertainty evaluation and theoretical methods to model optical instruments. During his career, he was a leader of several professional societies and a visiting professor at Loughborough University and the Harbin Institute of Technology. These days, he is partially retired and focusing on an ERC Advanced grant on using advanced mathematics and machine learning to increase optical instrument data processing.
Inhaltsangabe
Chapter 1 Basic Concepts Chapter 2 General principles of dimensional metrology Chapter 3 Measurement uncertainty Chapter 4 Interferometry Chapter 5 Sensor principles Chapter 6 Material dimensional and angle measures Chapter 7 Dimensional measurement equipment and measurands Chapter 8 Coordinate measurements Chapter 9 Surface topography filtering and characterization Chapter 10 Appendix: The least squares method
