J. M. Zuo, J. C. H. Spence

Electron Microdiffraction

• Gebundenes Buch

Produktbeschreibung

Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R. H(lJier in 1988, and from a return visit to Trondheim by J. C. H. S. in 1990. We are therefore particularly grateful to Professor H(lJier and his students and co-workers for their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O'Keeffe for his encouragement. The depth of his under standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable sounding board for ideas, and was responsible for much of the experimental and theoretical work on coherent nanodiffraction. The sections on this topic derive mainly from collaborations by J. C. H. S. with him in the seventies.

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Produktdetails

• Verlag: Springer / Springer US / Springer, Berlin
• Artikelnr. des Verlages: 978-0-306-44262-9
• 1992.
• Seitenzahl: 386
• Erscheinungstermin: 31. Dezember 1992
• Englisch
• Abmessung: 241mm x 160mm x 26mm
• Gewicht: 721g
• ISBN-13: 9780306442629
• ISBN-10: 0306442620
• Artikelnr.: 22226598

Inhaltsangabe

1. A Brief History of Electron Microdiffraction.- 2. The Geometry of CBED Patterns.- 3. Theory.- 4. The Measurement of Low-Order Structure Factors and Thickness.- 5. Applications of Three- and Many-Beam Theory.- 6. Large-Angle Methods.- 7. Symmetry Determination.- 8. Coherent Nanoprobes. STEM. Defects and Amorphous Materials.- 9. Instrumentation and Experimental Technique.- References.- Appendix 1. Useful Relationships in Dynamical Theory.- Appendix 2. Electron Wavelengths, Physical Constants, etc..- Appendix 3. Crystallographic Data.- A3.1. The Reciprocal Lattice.- A3.2. The Seven Crystal Systems.- A3.3. Interplanar Spacings.- A3.4. Extinction Conditions Resulting from Screw and Glide Symmetry.- A3.5. Symmetries in Zone-Axis CBED Patterns.- A3.7. The Use of a Metric Matrix for Crystallographic Calculations.- Appendix 4. Indexed Diffraction Patterns with HOLZ.- Appendix 5. Computer Programs.- A5.1. Plotting HOLZ Lines.- A5.2. Bloch-wave Dynamical Programs.- A5.3. Multislice Programs.- Appendix 6. Crystal Structure Data.- Appendix 7. A Bibliography of CBED Applications Indexed by Material.- References for the Appendixes.