Nobuo Tanaka

Broschiertes Buch

Electron Nano-Imaging

Basics of Imaging and Diffraction for TEM and STEM

Beschreibung

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide fortoday's graduate students and professionals just starting their careers.

Autor

Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC). He received a ph.D degree from Applied Physics Department of Nagoya University in 1978, and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004. He was the director of the institute from 2012 to 2015. He is also the president of Japanese Microscopy Society (JSM) from 2015 to 2017. His professionals are high-resolution electron microscopy and nano-diffraction, and physics of atomic clusters and thin filmsas well as surfaces and interfaces of semiconductors. He is also the editor/author of a textbook as Scanning Transmission Electron Microscopy of Nanomaterials.

Produktdetails

• Verlag: Springer / Springer Japan / Springer, Berlin
• Artikelnr. des Verlages: 978-4-431-56804-9
• 2017
• Seitenzahl: 364
• Erscheinungstermin: 25. Juli 2018
• Englisch
• Abmessung: 235mm x 155mm x 19mm
• Gewicht: 618g
• ISBN-13: 9784431568049
• ISBN-10: 4431568042
• Artikelnr.: 53570209