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Produktbild: Electron Nano-Imaging
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Electron Nano-Imaging Basics of Imaging and Diffraction for TEM and STEM

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84,99 € UVP 96,29 €

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

25.07.2018

Abbildungen

XXVIII, 333 p. 129 illus., 22 illus. in color.

Verlag

Springer Tokyo

Seitenzahl

333

Maße (L/B/H)

23,5/15,5/1,9 cm

Gewicht

618 g

Auflage

Softcover Reprint of the Original 1st 2017 edition

Sprache

Englisch

ISBN

978-4-431-56804-9

Beschreibung

Rezension

“I enjoyed reading this book. It covers a wide range of applications, from basics on electron microscopy and diffraction, to more advanced, newly developed techniques for imaging and diffraction. … I strongly recommend this book as a resource for electron microscopists with a basic knowledge of TEM and STEM who are interested in advanced imaging and diffraction techniques.” (Lourdes Salamanca-Riba, MRS Bulletin, Vol. 43, May, 2018)

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

25.07.2018

Abbildungen

XXVIII, 333 p. 129 illus., 22 illus. in color.

Verlag

Springer Tokyo

Seitenzahl

333

Maße (L/B/H)

23,5/15,5/1,9 cm

Gewicht

618 g

Auflage

Softcover Reprint of the Original 1st 2017 edition

Sprache

Englisch

ISBN

978-4-431-56804-9

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: GPSR Kontakt

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  • Produktbild: Electron Nano-Imaging

  • Seeing nanometer-sized world.- Structure and imaging of a transmission electron microscope (TEM).- Basic theories of TEM imaging.- Resolution and image contrast of a transmission electron microscope (TEM).- What is high-resolution transmission electron microscopy ?.- Lattice images and structure images.- Imaging theory of high-resolution TEM and image simulation.- Advanced transmission electron microscopy.- What is scanning transmission electron microscopy (STEM)?.- Imaging of scanning transmission electron microscopy (STEM).- Image contrast and its formation mechanism in STEM.- Imaging theory for STEM.- Future prospects and possibility of TEM and STEM.- Concluding remarks.- Introduction of Fourier transforms for TEM and STEM.- Imaging by using a convex lens: Convex lens as phase shifter.- Contrast transfer function of a transmission electron microscope: Key term for understanding of phase contrast in HRTEM.- Complex-valued expression of aberrations of a round lens.- Cowley's theoryfor TEM and STEM imaging.- Introduction to the imaging theory for TEM including non-linear terms.- What are image processing methods?.- Elemental analysis by electron microscopes: Analysis using an electron probe.- Electron beam damage to specimens.- Scattering of electrons by an atom: Fundamental process for visualization of a single atom by TEM.- Electron diffraction and convergent beam electron diffraction (CBED): Basis for formation of lattice fringes in TEM and image intensity of STEM.- Bethe's method for dynamical electron diffraction: Basic theory of electron diffraction in thicker crystals.- Column approximation and Howie-Whelan's method for dynamical electron diffraction: Theory for observation of lattice defects.- Van-Dyck's method for dynamical electron diffraction and imaging: Basis of atomic column imaging.- Eikonal theory for scattering of electrons by a potential.- Debye-Waller factor and thermal diffuse scattering (TDS).- Relativistic effects to diffraction and imagingby a transmission electron microscope: Basic theories for high-voltage electron microscopy.