This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.
This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.
Introduction.- Memory Choices (TCM/Cache).- Cache memory.- Embedded Memory hierarchy.- Memory cell choices.- Banking Options and Data Array Organization.- Memory Implementation.- Memory operation and yield.- Low Power Design for Embedded Memory.- Design For Test.- Power Characterization.- Memory characterizations.
Introduction.- Cache Architecture and Main Blocks.- Embedded Memory Hierarchy.- SRAM Memory Operation and Yield.- Low Power and High Yield SRAM Memory.- Leakage Reduction.- Embedded Memory Verification.- Embedded Memory Design Validation and Design For Test.- Emerging Memory Technology Opportunities and Challenges.
Introduction.- Memory Choices (TCM/Cache).- Cache memory.- Embedded Memory hierarchy.- Memory cell choices.- Banking Options and Data Array Organization.- Memory Implementation.- Memory operation and yield.- Low Power Design for Embedded Memory.- Design For Test.- Power Characterization.- Memory characterizations.
Introduction.- Cache Architecture and Main Blocks.- Embedded Memory Hierarchy.- SRAM Memory Operation and Yield.- Low Power and High Yield SRAM Memory.- Leakage Reduction.- Embedded Memory Verification.- Embedded Memory Design Validation and Design For Test.- Emerging Memory Technology Opportunities and Challenges.
Es gelten unsere Allgemeinen Geschäftsbedingungen: www.buecher.de/agb
Impressum
www.buecher.de ist ein Internetauftritt der buecher.de internetstores GmbH
Geschäftsführung: Monica Sawhney | Roland Kölbl | Günter Hilger
Sitz der Gesellschaft: Batheyer Straße 115 - 117, 58099 Hagen
Postanschrift: Bürgermeister-Wegele-Str. 12, 86167 Augsburg
Amtsgericht Hagen HRB 13257
Steuernummer: 321/5800/1497