Kaushik Kumar, Divya Zindani

Engineering Materials Characterization

• Broschiertes Buch

Produktbeschreibung

Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation.

The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.

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Produktdetails

• De Gruyter STEM
• Verlag: De Gruyter
• Seitenzahl: 252
• Erscheinungstermin: 20. November 2023
• Englisch
• Abmessung: 15mm x 170mm x 240mm
• Gewicht: 519g
• ISBN-13: 9783110997606
• Artikelnr.: 68499294

Inhaltsangabe

PART A MICROSCOPIC CHARACTERIZATION

Chapter 1: Optical Microscope

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Imaging Analysis and Interpretation.

Chapter 2: Scanning Electron Microscopy

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Imaging Analysis and Interpretation.

Chapter 3: Atomic Force Microscopy

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Imaging Analysis and Interpretation.

Chapter 4: Scanning Probe Microscopy

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Imaging Analysis and Interpretation.

Chapter 5: X-Ray Diffraction.

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Imaging Analysis and Interpretation.

PART B SPECTROSCOPIC CHARACTERIZATION

Chapter 1: FTIR Spectrometer

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Data Analysis and Interpretation.

Chapter 2: Raman Spectrometer

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Data Analysis and Interpretation.

Chapter 3: X-ray Photoelectron Spectroscopy

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Data Analysis and Interpretation.

Chapter 4: Ultraviolet Photoelectron Spectroscopy

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Data Analysis and Interpretation.

Chapter 5: Fluorescence Spectroscopy

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Data Analysis and Interpretation.

Chapter 6: Nuclear Magnetic Resonance Spectroscopy

1. Introduction



2. Instrumental Details



3. Working And Handling of Instruments



4. Sample Preparation



5. Data Analysis and Interpretation.