Far- and Near-field characterization of small radiation sources - Shin, Dongjae;Chavez-Pirson, Arturo;Lee, Yong-Hee
38,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in 6-10 Tagen
  • Broschiertes Buch

This book presents experimental studies on small radiation sources such as subwavelength apertures, photonic crystal lasers, and microdisk lasers in their far- and near-field regimes. For the far-field characterization of highly divergent emissions, a solid angle scanner which is capable of scanning a detector and necessary optics over the surface of a sphere centered at the sources is developed. Polarization-resolved two-dimensional angular distributions are measured with this instrument. For the near-field characterization of subwavelength structures, a near-field scanning optical microscope…mehr

Andere Kunden interessierten sich auch für
Produktbeschreibung
This book presents experimental studies on small radiation sources such as subwavelength apertures, photonic crystal lasers, and microdisk lasers in their far- and near-field regimes. For the far-field characterization of highly divergent emissions, a solid angle scanner which is capable of scanning a detector and necessary optics over the surface of a sphere centered at the sources is developed. Polarization-resolved two-dimensional angular distributions are measured with this instrument. For the near-field characterization of subwavelength structures, a near-field scanning optical microscope which scans a fiber probe over the source surface with shear-force distance regulation using dual tuning forks is developed. Spectrally-resolved near- field images are measured with this instrument.
Autorenporträt
Dong Jae Shin was born in Andong, Korea, in 1973. He received Ph.D. in Physics at Korea Advanced Institute of Science and Technology (KAIST), Korea, in 2001. He is currently with Samsung Electronics working on silicon photonics and its application to DRAMs. He has over 100 technical publications and patents. He is a member of the IEEE.