Generalized Continua as Models for Materials

with Multi-scale Effects or Under Multi-field Actions
Herausgegeben:Altenbach, Holm; Forest, Samuel; Krivtsov, Anton

• Gebundenes Buch

Produktbeschreibung

This volume presents contributions describing the micro- and macro-behaviours, new existence and uniqueness theorems, the formulation of multi-scale problems, etc. and now it is time to ponder again the state of matter and to discuss new trends and applications.
The main focus is directed on the following items
- Modelling and simulation of materials with significant microstructure,
- Generalized continua as a result of multi-scale models,
- Multi-field actions on materials resulting in generalized material models, and
- Comparison with discrete modelling approaches

Produktdetails

• Advanced Structured Materials 22
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 86146171, 978-3-642-36393-1
• 2013
• Seitenzahl: 344
• Erscheinungstermin: 29. Mai 2013
• Englisch
• Abmessung: 241mm x 160mm x 24mm
• Gewicht: 650g
• ISBN-13: 9783642363931
• ISBN-10: 3642363938
• Artikelnr.: 37057164

Autorenporträt

Prof. Dr.-Ing. habil. Holm Altenbach lehrt Technische Mechanik an der Otto-von-Guericke-Universität Magdeburg. Seine Forschungsschwerpunkte liegen auf verschiedenen Gebieten der Kontinuumsmechanik (Plattentheorie, Kriechschädigungsmechanik, Mechanik der Komposite).

Inhaltsangabe

From the Contents: Hierarchical architecture and multi-scale modeling of bio-inspired stimuli-responsive polymer nano-composites.- A multiscale modeling approach of waves in materials with inherent microstructure.- Coordinate-free derivation of anisotropic plate and shell models by asymptotic analysis: Coordinate-free derivation of anisotropic plate and shell models by asymptotic analysis.- A micromechanics-based model for shear-coupled grain boundary migration in bicrystals.- Preliminary application to higher gradient continua and gravitation.- Grain boundary modelling using a theory of dislocation and disclination fields.