Genetic Variability and Association Studies in Wheat - Pandey, Manoj Kumar;Kumar, Arun;Singh, B. N.
29,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in 1-2 Wochen
payback
15 °P sammeln
  • Broschiertes Buch

The field experiment was conducted at Genetics and Plant Breeding Research Farm, Narendra Deva University of Agriculture and Technology, Faizabad. The experimental material comprised of 140 exotic and indigenous lines of bread wheat along with three checks were evaluated in partially reclaimed salt affected soil under late sown and irrigated conditions during Rabi, 2010-11, in Augmented Block Design having 7 blocks of 23 plots each. The characters studied were Flag leaf area, days to maturity, plant height, No. of reproductive tillers per plant, spike length, peduncle length, grains per spike,…mehr

Andere Kunden interessierten sich auch für
Produktbeschreibung
The field experiment was conducted at Genetics and Plant Breeding Research Farm, Narendra Deva University of Agriculture and Technology, Faizabad. The experimental material comprised of 140 exotic and indigenous lines of bread wheat along with three checks were evaluated in partially reclaimed salt affected soil under late sown and irrigated conditions during Rabi, 2010-11, in Augmented Block Design having 7 blocks of 23 plots each. The characters studied were Flag leaf area, days to maturity, plant height, No. of reproductive tillers per plant, spike length, peduncle length, grains per spike, 1000-grain weight, biological yield per plant, harvest-index, grain yield per plant, flag leaf angle ,leaf blight (double digit system). The data on 13 characters was utilized for estimation of mean, range and least significant differences, correlations, path-coefficients and genetic divergence. The genotypes, 29th ESWYT-130, 42nd IBWSN-1158, 27th SAWSN-3107, EC-664236, EC-634300-110, IC-524282, and 19th HRWSN-2026 produced higher grain yield per plant.
Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Autorenporträt
Manoj Kumar Pandey trabalha actualmente como Professor Assistente no departamento de ECE, Amity University Haryana, Índia. Recebeu o grau de M. Tech. da Universidade de Thapar, Patiala, Punjab, Índia. Está a tirar o doutoramento em Processamento de Imagem. Os seus interesses de investigação são Processamento de Imagem, Sistemas Incorporados e Medição e Controlo.