Michael Pecht, Riko Radojcic, Gopal Rao

Guidebook for Managing Silicon Chip Reliability

• Gebundenes Buch

Produktbeschreibung

This is an excellent text detailing situations the professional will encounter in practice. The book: * Includes an extensive table detailing the types of mechanism failures, such as self-heating and hot carrier aging. * Examines deep sub-micron challenges, such as power dissipation, switching noise, and cross talk * Outlines how to establish the specifications defining chip performance, cost, quality, and reliability. * Concentrates on device failure and causes throughout the text - showing how to model the mechanism, test for defects, and avoid and manage damange. * Presents information on evolving IC technologies. TOC:Introduction.- How Devices Fail.- Intrinsic Device Sensitivities.- Electromigration.- Hot Carrier Aging.- Time Dependent Dielectric Breakdown. Mechanical Stress Induced Migration.- Alpha Particle Sensitivity.- Electrostatic Discharge and Electrical Overstress. Latch-Up. Qualification. Screening. Design for Reliability. Summary.

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Produktdetails

• Verlag: CRC Press / Taylor & Francis Ltd (Sales)
• Seitenzahl: 224
• Erscheinungstermin: 29. Dezember 1998
• Englisch
• Abmessung: 243mm x 163mm x 18mm
• Gewicht: 517g
• ISBN-13: 9780849396243
• ISBN-10: 0849396247
• Artikelnr.: 21135605

Autorenporträt

Pecht, Michael; Radojcic, Riko; Rao, Gopal

Inhaltsangabe

Introduction How Devices Fail Intrinsic Mechanisms Extrinsic Mechanisms
Intrinsic Device Sensitivities Device Transconductance Sensitivities
Leakage Current Sensitivities Breakdown Issues Electromigration Description
of the Mechanism Modeling of the Mechanism How to Detect/Test How to Manage
Hot Carrier Aging Description of the Mechanism Modeling of the Mechanism
Detection of Hot Carrier Aging Avoidance of Hot Carrier Aging Time
Dependent Dielectric Breakdown Description of the Mechanism Modeling of the
Mechanism How to Detect/Test How to Avoid and Manage Mechanical Stress
Induced Migration Description of the Mechanism Modeling of the Mechanism
How to Detect/Test How to Manage Alpha Particle Sensitivity Description of
the Mechanism Modeling of the Mechanism Prevention of Alpha Particle
Induced Damage Electrostatic Discharge and Electrical Overstress
Description of the Mechanism Modeling of the Mechanism Avoiding ESD/EOS
Failures Latch-Up Description of the Mechanism How to Detect How to Avoid
Qualification Qualification Testing Virtual Qualification Screening
Functional Tests Burn-In Tests Iddq Tests Design for Reliability Design
System Effective Management of Wear-Out Failures Extrinsic Reliability
Mechanisms Infant Mortality Failure Mechanisms Circuit Sensitivities
Summary