Handbook of Metrology and Applications
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This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in…mehr

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Produktbeschreibung
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world's leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, includingample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
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Autorenporträt
Dr. D.K. Aswal is present Director of Health, Safety and Environment Group, Bhabha Atomic Research Center, Mumbai. He is an accomplished scientist of international repute in the areas of metrology and condensed matter research (molecular electronics, organic solar cells, thermoelectrics, superconductivity, low-dimensional materials, and gas sensors etc.). His current focus is to enhance the Metrological capabilities of India at par with international standards and to strengthen the "Quality-infrastructure (metrology, accreditation and standards)" of India for inclusive growth and for its quick transformation from a developing-state to a developed-state. His "Aswal Model" puts accurate and precise measurements traceable to SI units at the core of four helices (government, academia, industry and civil society) responsible for the inclusive growth. He has edited nine books, contributed over 30 book chapters, published over 500 research papers (H-index of 53) and filed ninepatents. He is an elected fellow of National Academy of Sciences, India (NASI); Academician, Asia Pacific Academy of Materials; Fellow, International Academy of Advanced Materials (Sweden). He had visiting Professor/scientist positions at Institut d 'Electronique de Microelectronique et de Nanotechnologie (France), Shizuoka University (Japan), Commissariat à l'Energie Atomique (France), Weizmann Institute of Science (Israel), University of Yamanashi (Japan), University of Paris VII (France), Karlsruhe Institute of Technology (Germany), University of South Florida (USA), etc. He is recipient of several international/national fellowships, including JSPS (Japan), BMBF (Germany), EGIDE (France), Homi Bhabha Science and Technology Award, DAE-SRC outstanding Research Investigator Award, HBNI Distinguished Faculty award etc.  He has also served as Chairman (Interim), National Accreditation board of Testing and Calibration laboratories (NABL), Gurugram (2019-2020); Director, Additional Charge, CSIR-Central Electronic Research Institute, Pilani (2019-2020); Director, Additional Charge, CSIR-NISTADS, New Delhi (2018-2019) and Secretary, Atomic Energy Education Society (AEES), Mumbai (2012-2015).   Prof. Sanjay Yadav, born in 1962, obtained his master degree in science (M.Sc.) in 1985 and Ph.D. degree in Physics in 1990. Presently, he is working as the Editor-in-Chief (EIC) of the MAPAN: The Journal of Metrology Society of India. He is also Vice President of Metrology Society of India (MS), New Delhi as well as Vice President of Ultrasonic Society of India (USI), New Delhi. He is Former Chief Scientist and Head, Physico Mechanical Metrology Division of NPL and also Former Professor, Faculty of Physical Sciences, Academy of Scientific and Innovative Research (AcSIR), HRDG, Ghaziabad. He had taught 'Advanced Measurement Techniques & Metrology' course, taken practical classes and supervising graduate, master and Ph.D. students since 2011. He is the recipient of research scholarships from Ministry of Home Affairs, India (1986); CSIR, India (1988); Col. G.N. Bajpayee Award of Institution of Engineers, India (1989); Commendation Certificates from Haryana Government (1991 & 1992); JICA Fellowship of JAPAN (1998), Commendation Certificates from SASO, Saudi Arabia (2003); 3 Appreciation Certificates from Director, NPL (2005); Managing Editor, MAPAN (2006-2014); nominated as Member of APMP Technical Committee of Mass Related Quantities (TCM), Australia (2013-2019); Nominated as Country Representative in APMP, China (2019); Vice President, Metrology Society of India (2020); Member, National Advisory Committee, NCERT, Delhi (2019); Members, Testing and Calibration Advisory Committee, BIS (2019, 2020 and 2021), and very recently received a prestigious International award i.e. APMP Award for Developing Economies, China (2020). He has significantly contributed in the field of pressure metrology, biomedical instrumentation, ultrasonic transducers and instrumentation systems. His current research interests include research and developmental activities in physico mechanical measurements; establishment, realization, maintenance and up-gradation of national pressure and vacuum standards; dissemination of national practical pressure scale to users through apex level calibration, training and consultancy services; inter-laboratory comparisons, proficiency testing programme and key comparisons, implementation of Quality System in the laboratory as per ISO/IEC 17025 standard and Finite Element Analysis (FEA) and Monte Carlo Simulations for pressure balances. He has published more than 450 research papers in the national and international journals of repute and conferences, 20 books, 14 patents and copyrights, supervised 8 PhDs (another 5 in waiting), drafted several projects, scientific and technical reports, documents and policy papers. Dr. Toshiyuki TAKATSUJI, a mechanical Engineer joined National Research Laboratory of Metrology (NRLM) in 1990. He also served as Visiting Scientist, National Measurement Laboratory, and Australia during 1994-1996; The NRLM reorganized to NMIJ, AIST in 2001 and since then he is working in NMIJ on various scientific projects and also playing leadership role in APMP, serving as its Chairman from 2016-2019. In world metrology arena, his contributions to dimensional metrology would always be the talking and reference points. He has been actively working not only in scientific but also in legal metrology area as a member of International Committee of Legal Metrology (CIML).   Prem Rachakonda is a mechanical engineer in the Intelligent Systems Division at the National Institute of Standards and Technology (NIST), USA. His work primarily addresses technical and standardization activities for industrial metrology, automation, autonomous vehicle perception, and strategic planning. His current work is focused on developing the necessary measurement science to verify and validate 3D vision systems used for manufacturing automation, and autonomous vehicle applications. Additionally, he has previously worked on developing standards for 3D lidars and developing technology for achieving nanoscale measurements. His work is now part of an ASTM standard adopted by measurement software and hardware companies. He holds several leadership roles on standards development task groups with organizations such as ISO, ASTM & SAE and is on the editorial boards of multiple scientific journals.   Dr. Harish Kumar received B.Tech. degree in Mechanical and Automation Engineering from the Guru Gobind Singh Indrapsatha University, New Delhi, India, in 2003 and the Ph.D. degree in Mechanical Engineering from Guru Gobind Singh Indraprastha University, New Delhi, India, in 2015. His thesis was on design and development of force transducers. He worked at National Physical Laboratory, New Delhi, India during 2007 to 2017 as Scientist and worked in the force and mass metrology. He has worked in the design and development of Kibble balance. Since 2017, he has been working at National Institute of Technology Delhi, India, and currently working in additive manufacturing in addition to metrology. He has published more than 100 papers in peer-reviewed journals/conferences of repute.