Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and…mehr
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.Hinweis: Dieser Artikel kann nur an eine deutsche Lieferadresse ausgeliefert werden.
Dr. Joel P. Dunsmore, Research Fellow at Keysight Technologies, California, USA Since graduating from Oregon State University with a BSEE (1982) and an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies (formerly Agilent Technologies, and Hewlett-Packard) at the Sonoma County Site. He received his Ph.D. from Leeds University in 2004. He was a principle contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and Microwave circuit designs in these products. Recently, he has worked in the area of non-linear test including differential devices, and mixer measurements. He has received 31 patents related to this work, has published numerous articles on measurement technology, as well as consulting on measurement applications. He has taught electrical circuit fundamentals at the local university and co-taught an RF course at the University of California, Berkeley, and presented several short courses and seminars through ARFTG, MTT, EMC, and Keysight.
Inhaltsangabe
Foreword to the Second Edition xvii
Foreword to the First Edition xix
Preface to the Second Edition xxi
Preface to the First Edition xxiii
Acknowledgments for the Second Edition xxv
Acknowledgments from the First Edition xxvii
1 Introduction to Microwave Measurements 1
1.1 Modern Measurement Process 2
1.2 A Practical Measurement Focus 3
1.3 Definition of Microwave Parameters 3
1.3.1 S-Parameter Primer 4
1.3.2 Phase Response of Networks 11
1.4 Power Parameters 13
1.4.1 Incident and Reflected Power 13
1.4.2 Available Power 13
1.4.3 Delivered Power 14
1.4.4 Power Available from a Network 14
1.4.5 Available Gain 15
1.5 Noise Figure and Noise Parameters 15
1.5.1 Noise Temperature 16
1.5.2 Effective or Excess Input Noise Temperature 17
1.5.3 Excess Noise Power and Operating Temperature 17
1.5.4 Noise Power Density 17
1.5.5 Noise Parameters 18
1.6 Distortion Parameters 19
1.6.1 Harmonics 19
1.6.2 Second-Order Intercept 19
1.6.3 Two-Tone Intermodulation Distortion 20
1.6.4 Adjacent Channel Power and Adjacent Channel Level Ratio 23
1.6.5 Noise Power Ratio (NPR) 24
1.6.6 Error Vector Magnitude (EVM) 25
1.7 Characteristics of Microwave Components 26
1.8 Passive Microwave Components 27
1.8.1 Cables, Connectors, and Transmission Lines 27
1.8.2 Connectors 31
1.8.3 Non-coaxial Transmission Lines 44
1.9 Filters 47
1.10 Directional Couplers 49
1.11 Circulators and Isolators 51
1.12 Antennas 52
1.13 PC Board Components 53
1.13.1 SMT Resistors 53
1.13.2 SMT Capacitors 56
1.13.3 SMT Inductors 57
1.13.4 PC Board Vias 57
1.14 Active Microwave Components 58
1.14.1 Linear and Non-linear 58
1.14.2 Amplifiers: System, Low-Noise, High Power 58
1.14.3 Mixers and Frequency Converters 59
1.14.4 Frequency Multiplier and Limiters and Dividers 61
1.14.5 Oscillators 62
1.15 Measurement Instrumentation 63
1.15.1 Power Meters 63
1.15.2 Signal Sources 64
1.15.3 Spectrum Analyzers 65
1.15.4 Vector Signal Analyzers 66
1.15.5 Noise Figure Analyzers 67
1.15.6 Network Analyzers 67
References 70
2 VNA Measurement Systems 71
2.1 Introduction 71
2.2 VNA Block Diagrams 72
2.2.1 VNA Source 73
2.2.2 Understanding Source-Match 76
2.2.3 VNA Test Set 82
2.2.4 Directional Devices 85
2.2.5 VNA Receivers 91
2.2.6 IF and Data Processing 95
2.2.7 Multiport VNAs 97
2.2.8 High-Power Test Systems 104
2.2.9 VNA with mm-Wave Extenders 105
2.3 VNA Measurement of Linear Microwave Parameters 107
2.3.1 Measurement Limitations of the VNA 107
2.3.2 Limitations Due to External Components 111
2.4 Measurements Derived from S-Parameters 112
2.4.1 The Smith Chart 112
2.4.2 Transforming S-Parameters to Other Impedances 117
2.4.3 Concatenating Circuits and T-Parameters 118
2.5 Modeling Circuits Using Y and Z Conversion 120
2.5.1 Reflection Conversion 120
2.5.2 Transmission Conversion 120
2.6 Other Linear Parameters 121
2.6.1 Z-Parameters, or Open-Circuit Impedance Parameters 122
2.6.2 Y-Parameters, or Short-Circuit Admittance Parameters 123<
